Integrated noise parameter measuring device and method

Abstract

The invention discloses an integrated noise parameter measuring device and method and belongs to the technical field of electronic test. The integrated noise parameter measuring device comprises an Sparameter measuring module, an electronic impedance tuner Zx, a noise measuring module and a local oscillator; the S parameter measuring module comprises a signal source, reference coupler CR1, reference coupler CR2, reference measuring receiver R1, reference measuring receiver R1, port coupler CP1, port coupler CP2, measuring receiver A and measuring receiver B; the noise measuring module comprises switch circuit SW and noise power measuring circuit NR; the port coupler CP1 is connected with port 1, and the port coupler CP2 is connected with port 2. The S parameter measuring module, the noisemeasuring module, the electronic impedance tuner and the local oscillator are integrated in a case; noise parameters, noise coefficient and S parameter can be precisely and quickly measured at the same time for a test piece; the device and method have the advantages of good calibration convenience, high measuring precision, high speed and the like.

Description

technical field [0001] The invention belongs to the technical field of electronic testing, and in particular relates to an integrated noise parameter measuring device and a measuring method. Background technique [0002] Any electrical system generates noise, which limits the ability of circuits and systems to receive and process weak signals. Noise figure is one of the most important parameters to quantify the ability of a receiver to handle weak signals. The technological progress of electronic equipment and equipment such as microwave and millimeter wave communications, radar, navigation, and precision guidance is closely related to the increasingly improved receiver technology, which is very important One aspect of this is to minimize the noise generated by the receiver itself and reduce the noise figure. To achieve this goal, it is necessary to know the relevant factors that affect the size of the noise figure. These factors can be described by the model shown in equat...

AI Technical Summary

Problems solved by technology

When the parameters of each component of the system drift, the measurement system must be disassembled and the S parameters of each component must be re-measured.

In addition, the switches and impedance adjusters in the system have switching repeatability errors due to the use of mechanical structures.

Therefore, the measurement accuracy of this automatic noise parameter measurement system is not high, and it is very inconvenient to use

[0021] (2) The measurement speed is slow

This is mainly caused by two factors: first, because the impedance adjuster with mechanical structure is used to realize the change of source impedance, and the stepping motor is used to move the position of the admittance element to realize the impedance change in the specific implementation, which is affected by the defects of the mechanical structure itself and Insufficient limitations for high-speed measurements

In addition, the bus speed of the measurement system and the extra time spent waiting for the measurement data to stabilize will also affect the measurement speed

[0022] (3) Broadband measurement across multiple octaves cannot be realized in a single time, and the system composition is huge

In addition, the lower the frequency, the larger the volume of the mechanical impedance adjuster. Due to the size limitation, the current mechanical impedance adjuster generally cannot cover the frequency band below 500MHz.

[0023] (4) At present, the Y factor method is mainly used in the measurement of noise figure, because it cannot correct the noise parameter effect error and mismatch error of the DUT itself and the measurement system, and has the disadvantage of large measurement uncertainty

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