Feature selection method and device

A feature selection method and feature selection technology, applied in the field of spectral analysis, can solve the problems of large variation and poor stability of selected features

Active Publication Date: 2018-10-19
BEIJING ACADEMY OF AGRICULTURE & FORESTRY SCIENCES
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Problems solved by technology

These methods are all single-feature selection methods. When a small amount of local variatio

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  • Feature selection method and device

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Embodiment Construction

[0021] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are the Some, but not all, embodiments are invented. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the embodiments of the present invention.

[0022] see figure 1 , this embodiment discloses a feature selection method, including:

[0023] S1. Obtain the spectral data set of the sample, wherein the spectral data set of the sample includes spectral data of a specific number of samples, and the content of the target substance in the sample;

[0024] S2. Sampling the spectral data set for the ...

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Abstract

The embodiment of the invention discloses a feature selection method and device which can select measured target object features in spectral nondestructive testing, and have good robustness and stability. The method comprises: S1, acquiring a spectral data set of a sample; S2, performing a first quantity of sampling on the spectral data set to obtain a first quantity of sample spaces, constructinga partial least square quantitative analysis model by using each sample space, and ranking the features corresponding to the sample space in order of importance based on the partial least square quantitative analysis model; S3, ranking the features corresponding to the first quantity of sample spaces according to an importance ranking result of the features corresponding to the first quantity ofsample spaces to obtain a feature ranking result, determining a feature selection quantity based on the feature ranking result, and using the first feature selection quantity of features as the targetfeatures according to the feature ranking result.

Description

technical field [0001] Embodiments of the present invention relate to the field of spectral analysis, and in particular to a feature selection method and device. Background technique [0002] Spectrum-based non-destructive testing technology has the advantages of simple operation, fast, non-destructive, no need for pretreatment and auxiliary reagents, and is widely used in agriculture, chemical industry, environment, medicine and other fields. However, the obtained spectral data usually has the characteristics of large number of characteristic wavelengths, small sample size, and collinearity between features, which makes the direct use of all features to establish a model ineffective. Existing studies have shown that the feature selection method is used to select the wavelength and then build the model, which has the advantages of improving model accuracy, simplifying model complexity, speeding up model operation speed, and enhancing model interpretability. [0003] Common ...

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Application Information

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IPC IPC(8): G06K9/00
CPCG06F2218/08
Inventor 罗娜韩平王冬王世芳
Owner BEIJING ACADEMY OF AGRICULTURE & FORESTRY SCIENCES
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