Testing method, device, system and storage medium for electronic equipment

Abstract

The present application relates to a testing method, device, system and storage medium of electronic equipment. The method includes: receiving a test configuration item request sent by a plurality of electronic devices; sending a plurality of test configuration items to the plurality of electronic devices according to the plurality of test configuration item requests, so that the plurality of electronic devices can test the plurality of test configuration items Configuration items are tested; among them, the test cases corresponding to all test configuration items in the same electronic device are executed in parallel, and multiple electronic devices execute their respective test cases synchronously and independently. The test cases in each electronic device are based on the Linux system test case. This method executes multiple test cases based on the linux system synchronously and in parallel through multiple electronic devices, which greatly shortens the test time of electronic devices, improves the efficiency of production line testing, and eliminates the adaptation caused by frequent upgrades of Android versions operation, shortening the time for production line debugging, thereby further improving the efficiency of production line testing and reducing product costs.

Description

technical field [0001] The present application relates to the field of communications, and in particular, to a testing method, apparatus, system and storage medium for electronic equipment. Background technique [0002] With the development of electronic science and technology, electronic equipment occupies a pivotal position in people's lives, and the competition in the electronic equipment market is also increasingly fierce. Taking electronic terminals as an example, in addition to the fierce competition in the market, the control of the production costs of their respective products has also become an important means for electronic equipment to reduce costs and increase profits. Usually, the production testing time required by the production line testing process of electronic equipment occupies a large proportion of the product production time. Therefore, the production line efficiency has become an important factor affecting the product cost. [0003] At present, in the ...

AI Technical Summary

Problems solved by technology

[0005] Based on this, it is necessary to provide a testing method, device, system and storage medium for electronic equipment that can improve the efficiency of production line testing for the above-mentioned technical problems of low production line testing efficiency

Images