Structured light three-dimensional imaging method and system for highly reflective object surface

Abstract

The invention provides a structured light three-dimensional imaging method and system on the surface of a highly reflective object, and relates to the field of three-dimensional measurement. The method includes: projecting multiple groups of binary phase-shift coding patterns with the same frequency and different light intensities onto the surface of the measured object, generating a plurality of modulated picture groups under different light intensities according to the reflected images, and sorting them in descending order according to the light intensity; obtaining the light intensity The illumination saturation intensity of each pixel point in the largest group is obtained to obtain the saturated pixel point, determine the saturation area, obtain the replacement pixel point with the minimum illumination saturation intensity and the maximum illumination intensity corresponding to each saturated pixel point in the corresponding area of ​​each group, and Calculate the phase, replace the phase of the saturated pixel with the phase of the replaced pixel, and obtain the repaired three-dimensional image of the measured object. The invention effectively solves the problem of phase error due to high reflectivity and saturated light intensity when performing three-dimensional reconstruction on highly reflective objects, and has fast reconstruction speed and high accuracy.

Description

technical field [0001] The invention relates to the field of three-dimensional measurement, in particular to a structured light three-dimensional imaging method and system for the surface of a highly reflective object. Background technique [0002] At present, as a 3D reconstruction technology based on structured light measurement technology, Phase Measurement Profilometry (PMP) is widely used in 3D modeling, industrial manufacturing, product Quality inspection, biometrics and other fields. [0003] In the practical application of phase measurement profilometry, it is necessary for the camera to accurately obtain the reflected light when the encoded pattern is projected on the surface of the measured object as the basis for solving the phase. Due to the smooth surface and high reflectivity of highly reflective objects, the light intensity of pixels in some areas with extremely high light intensity in the captured picture is limited to the maximum quantization value of the c...

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Problems solved by technology

[0005] In view of this, the embodiment of the present invention provides a structured light three-dimensional imaging method and system for the surface of a highly reflective object, which is used to solve the problems of information distortion and measurement accuracy reduction caused by saturated light intensity of captured pictures in three-dimensional measurement

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