Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Reconstruction parameter searching method and system in three-dimensional reconstruction of cryo-electron microscope

A technology for three-dimensional reconstruction and reconstruction of parameters, applied in the field of structural biology, can solve the problems of slow spatial parameter search, low reliability, and inability to evaluate the reliability of parameter search, so as to improve the resolution of three-dimensional reconstruction, improve the Robust, easy-to-obtain results

Active Publication Date: 2018-09-07
TSINGHUA UNIV
View PDF6 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The present invention provides a method and system for searching reconstruction parameters in cryo-electron microscope three-dimensional reconstruction that overcomes the above-mentioned problems or at least partially solves the above-mentioned problems. The problem of not being able to evaluate the search reliability of each parameter

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Reconstruction parameter searching method and system in three-dimensional reconstruction of cryo-electron microscope

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0033] like figure 1 As shown in the figure, a search method for reconstruction parameters in three-dimensional reconstruction of cryo-electron microscope is shown, including:

[0034] Construct a parameter space, and for each experimental photo, perform random sampling in the parameter space by Monte Carlo simulation method, and obtain the likelihood of each sampling point and the experimental photo; specifically, for a given three-dimensional reference Object and an experimental photo, the three-dimensional reference object is projected according to a given set of parameters, and the similarity between the projection and the experimental photo is described by likelihood...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a reconstruction parameter searching method and system in the three-dimensional reconstruction of a cryo-electron microscope. The method comprises the following steps that: constructing a high-dimensional parameter space, carrying out random sampling on each experiment photo in the parameter space through a Monte Carlo simulation method, and calculating a likelihood betweenthe experiment photo and a given model on each sampling point; carrying out resampling on the sampling point of which the likelihood is greater than a set condition, generating a new random sampling point, and calculating the corresponding likelihood; repeating a resampling process until all sampling points are converged to be near the sampling point with the maximum likelihood; and taking the statistical distribution parameters of one series of converged sampling point as one statistical description for the reconstruction parameter of the experiment photo, and using for reconstructing the three-dimensional electronic density map of biomacromolecules. By use of the method, the imaging defocusing amount parameter of each biomacromolecule particle can be independently and accurately measured, and the three-dimensional reconstruction resolution ratio of the biomacromolecule can be greatly improved.

Description

technical field [0001] The present invention relates to the technical field of structural biology, and more specifically, to a method and system for searching reconstruction parameters in three-dimensional reconstruction of cryo-electron microscopy. Background technique [0002] The microscopic technique of using a transmission electron microscope to observe samples at low temperatures is called cryo-electron microscopy (cryo-EM), or cryo-EM for short. Cryo-electron microscopy is an important method for structural biology research. Together with the other two techniques: X-ray crystallography (X-ray crystallography) and nuclear magnetic resonance (nuclear magnetic resonance, NMR), it constitutes the core of high-resolution structural biology research. It is extremely important in obtaining the structure of biological macromolecules and revealing their functions. The basic principle of cryo-electron microscopy technology is to freeze the sample and then keep it at a low temp...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06T3/00
CPCG06T3/08
Inventor 李雪明胡名旭沈渊余洪坤杨广文顾凯
Owner TSINGHUA UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com