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Hollow cavity array with cavities having gradually-changed depths and in continuous distribution

A continuous, cavity technology, which is applied in the field of infrared temperature measurement, can solve the problems that the temperature measurement range is not wide enough, cannot be adjusted, and the working temperature range of the tape is narrow.

Pending Publication Date: 2018-07-27
CHINA JILIANG UNIV +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the currently used reference objects have two shortcomings. One is that the temperature measurement range is not wide enough. For example, the working temperature range of the tape is relatively narrow and cannot be used at higher temperatures; the other is that within the working temperature range, the emissivity of the reference object is a constant value, not adjustable

Method used

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  • Hollow cavity array with cavities having gradually-changed depths and in continuous distribution
  • Hollow cavity array with cavities having gradually-changed depths and in continuous distribution
  • Hollow cavity array with cavities having gradually-changed depths and in continuous distribution

Examples

Experimental program
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Embodiment Construction

[0017] combine figure 1 , figure 2 and image 3 , the preparation steps of the cavity depth gradient continuous cavity array are as follows:

[0018] (1) Making a metal component as the base 1;

[0019] (2) Grooving is made on the upper surface of the metal member base 1, and a rectangular groove 2 with a specific depth and width ratio is formed by processing, and a rectangular fin 3 is simultaneously formed;

[0020] (3) The processing of the rectangular groove 2 adopts the fine wire electric discharge cutting technology;

[0021] (4) The width of the rectangular grooves 2 is the same and distributed uniformly and continuously, and the depth increases proportionally to form a continuous cavity array with gradually changing cavity depth;

[0022] (5) Perform surface treatment on the cavity array, and use electroplating technology to coat Cr to form a metal coating 4. The working surface formed by the coating presents emission and absorption isotropy, which is close to a d...

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Abstract

The invention relates to the technical field of infrared temperature measurement and particularly relates to a hollow cavity array with cavities having gradually-changed depths and in continuous distribution. Normal emissivity on the work surface of an array has a stable distribution value and can be used as an emissivity reference substance in the process of the infrared temperature measurement.According to the technical scheme of the invention, a preparation method of the cavity body depth gradual change and continuous type hollow cavity array comprises the following steps: a rectangular metal member is made as a base for a hollow cavity array; a series of rectangular grooves is processed and formed on the upper surface of the base, the rectangular grooves have the same width and are continuously distributed uniformly, and the depths of the rectangular grooves are increased progressively in proportion; and surface treatment is performed on the hollow cavity array, and the surface, including the inner surface of the rectangular grooves, is covered with a metal coating. The hollow cavity array with the cavities having the gradually-changed depths and in continuous distribution adopts the preparation method and can provide a wide work temperature range; continuous and optional surface units are provided, and the optional surface units have stable emissivity in the work temperature range; and the entire hollow cavity array provides not only an emissivity value, but also an emissivity interval in the work temperature range.

Description

technical field [0001] The invention relates to the technical field of infrared temperature measurement, in particular to a cavity depth gradient continuous cavity array. The normal emissivity of the working surface of the array has a stable distribution value and can be used as an emissivity reference in infrared temperature measurement. Background technique [0002] Infrared temperature measurement technology has been widely used in civil and industrial fields. To measure the temperature of an object with an infrared temperature measuring device, it is necessary to know the surface emissivity of the object to be measured. However, it is difficult to determine the surface emissivity of an object, because the surface emissivity depends not only on the type of object material, but also on factors such as the surface condition of the object. In the process of infrared temperature measurement, in order to predetermine the surface emissivity, a common auxiliary method is to use...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/52
CPCG01J5/53
Inventor 李文军李佳琪郑永军
Owner CHINA JILIANG UNIV
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