Press device FOR TEST SORTER

Abstract

The invention relates to a pressure device supporting a test sorter for semiconductor device tests. In the pressure device for a test sorter, a pressurizing plate fixes a matching plate with one sideend of a matching plate and a corresponding opposite surface of a first guide rail having a first interval and the other side end of the matching plate and a corresponding opposite surface of a secondguide rail having a second interval, or, fixes the matching plate in a mode of being parallel to a mounting and dismounting movement direction of the matching plate and a virtual reference line passing the matching plate becoming a reference for thermal expansion or thermal contraction of the matching plate, the shortest distance between the virtual reference line and the central point of the matching plate being smaller than the shortest distance between the virtual reference line and two side ends of the matching plate, or the virtual reference line passing the central point. According to the press device for a test sorter, a semiconductor device and a tester can be ensured to be accurately electrically connected, and test sockets, insertion pieces, semiconductor devices and the like can also be prevented from being damaged.

Description

technical field [0001] The present invention relates to a pressurizing device for a test handler, and more particularly, to a pressurizing device for a test handler capable of responding to thermal expansion or contraction. Background technique [0002] After the multiple semiconductor devices produced are tested by the tester, they are divided into good products and defective products, and only good products are shipped. [0003] The electrical connection between the tester and the semiconductor device is realized by the test sorter, and the present invention is a technology capable of coping with thermal expansion or contraction during high-temperature testing or low-temperature testing. The technology of the testing sorter related to this present invention is disclosed in Korean Laid-Open Patent No. 10-2013-0079701, No. 10-2014-0147902 and Korean Authorized Patent No. 10-0709114. [0004] The test handler includes a loading device, a soak chamber, a test chamber, a press...

AI Technical Summary

Problems solved by technology

[0025] However, the existing technology is based on the structural design of two matching boards corresponding to one test tray, and it can be appropriately applied when the widths of the two matching boards are reduced based on the reference line. It is difficult to apply properly when the widths of the two matching plates are enlarged

The reason is that, when the respective widths of the two matching plates are made larger based on the reference line, the position of the pressing portion whose distance from the reference line is large will of course change greatly, so the above-mentioned problems still exist.

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