Repair method for complexing of inner flow passages of single-crystal or directional-crystal alloy blades
A repair method and a technology in the blade, which are applied in the field of epitaxial repair to realize the high-precision complex of the flow channel structure in the single crystal or oriented crystal alloy blade, and can solve the problems of easy occurrence, threat to the service safety of the blade, lack of grain boundary strengthening elements, etc. , to achieve the effect of extending service life
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0029] The specific embodiments of the present invention are given below in conjunction with the accompanying drawings, but the present invention is not limited to the following embodiments. Advantages and features of the present invention will become more apparent from the following description and claims. It should be noted that all the drawings are in very simplified form and use imprecise ratios, which are only used for the purpose of conveniently and clearly assisting in describing the embodiments of the present invention.
[0030] Please refer to figure 1 , figure 1 Shown is a flow chart of the repair method for realizing the reconstruction of the inner runner of a single crystal or oriented crystal alloy blade according to a preferred embodiment of the present invention.
[0031] The present invention proposes a method for repairing the inner runner of a single crystal or oriented crystal alloy blade, which includes the following steps:
[0032] Step S100: Before rep...
PUM
Property | Measurement | Unit |
---|---|---|
Dimensional accuracy | aaaaa | aaaaa |
Surface roughness | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com