Method and system for measuring three-dimensional shape

A three-dimensional topography, measured object technology, applied in measuring devices, instruments, optical devices, etc., can solve problems such as coarse matching errors, and achieve the effect of improving uniqueness

Active Publication Date: 2018-05-29
深度创新科技(深圳)有限公司
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Problems solved by technology

[0004] However, in traditional dephasing methods, the matching process usually only compares in the neighborhood space of candidate matching pixel pairs
However, in the actual measurement process, due to changes in the surface of the measured object such as illumination and / or appearance, this method of pixel point matching only in the two-dimensional matching window will produce coarse matching errors

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[0053] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other.

[0054]As mentioned above, when the object of 3D topography measurement is the measured object with illumination and / or appearance changes on the surface, since the stereoscopic image collected for it contains not only spatial axis information but also time axis information, therefore , if the two-dimensional matching window in the traditional stereo vision matching method is still used to complete the matching of pixel pairs, then the matching accuracy will inevitably be reduced.

[0055] In view of this, a method for three-dimensional shape measurement is proposed, see figure 1 It is a flow chart of a method for three-dimensional shape measurement in an embodiment, and the method includes:

[0056] S110. Periodically project M pieces of first phase shift images and N pieces of first binary random speckle...

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Abstract

The invention discloses a method for measuring a three-dimensional shape. The method comprises the steps that M first phase-shift images and N first two-value random speckle images are periodically projected to an object to be measured, wherein N first two-value random speckle images in the current period are different and also different from N first two-value random speckle images in the last period; M pairs of corresponding second phase-shift images and N pairs of corresponding second two-value random speckle images are obtained by periodically collecting the images; according to M pairs ofsecond phase-shift images in the current period, a wrapping phase position is calculated and obtained; according to N pairs of second two-value random speckle images in the last period and N pairs ofsecond two-value random speckle images in the current period, in combination with the wrapping phase position, disparity map calculation is conducted, and then the three-dimensional shape of the object to be measured is restored according to a disparity map. In addition, the invention further discloses a system for measuring the three-dimensional shape. According to the method and system, the precision and efficiency for measuring the three-dimensional shape of the object to be measured can be effectively improved.

Description

technical field [0001] The invention relates to three-dimensional surface measurement technology, in particular to a method and system for three-dimensional shape measurement. Background technique [0002] Three-dimensional surface measurement has a wide range of applications in product inspection, reverse engineering, 3D printing, anthropometry, human-computer interaction, animation production and other fields. Currently popular methods include laser scanning methods, stereo vision methods, time-of-flight (ToF) methods, and structured light methods. [0003] Among them, the structured light method based on fringe projection is widely used due to its advantages of high efficiency and low cost. The corresponding phase shift algorithm needs to project at least 3 phase shift images to the surface of the measured object, and then process at least 3 pairs of phase shift images corresponding to the above phase shift images collected by the stereo camera to obtain the phase at eac...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25
CPCG01B11/25G01B11/254
Inventor 徐玉华朱宪伟
Owner 深度创新科技(深圳)有限公司
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