Interconnection interface test method and device and computing equipment
A test device and interconnect interface technology, applied in the field of testing, can solve problems such as inability to precisely control the processor, lack of test completeness, and inability to cover test scenarios, so as to reduce processing overhead, improve test efficiency and processing capability, and solve processing problems. The effect of excessive load on the
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[0073] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.
[0074] see figure 1 , is a schematic structural diagram of a computing device provided by an embodiment of the present invention. In the embodiment of the present invention, the structure of the computing device 1 is described by taking two processors and two test devices as examples. The computing device 1 includes basic input Output system (Basic Input OutPut System, BIOS) 11, multiprocessor system, interconnect bus 16, cache 14, cache 15 and memory 17, multiproc...
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