Function test method and device of DSP module in FPGA chip

Abstract

The invention discloses a function test method and a function test device of a DSP module in an FPGA chip, and belongs to the field of FPGA chip technology. The function test method includes the stepsof performing the same function configuration on each DSP module inside an FPGA chip, and reading an input excitation into each DSP module through an MEM module inside the FPGA chip; conducting an XOR comparison between an output result of each DSP module with an expected output result stored in the MEM module to obtain multiple sets of multi-bit XOR results of each DSP module; and performing feedback OR operation on the multiple sets of multi-bit XOR results of each DSP module in sequence to feed back a previous set of OR operation results back sequentially to undergo OR operation with the following set, so that the multiple sets of multi-bit XOR results are finally reduced to one bit output to obtain a test result of each DSP module. According to the invention, the requirement on test conditions can be minimized, and the function test on all the DSP modules in the FPGA chip can be completed simply by means of the MEM module in the FPGA chip.

Description

technical field [0001] The invention relates to the technical field of FPGA chips, in particular to a function testing method and a function testing device of a DSP module in an FPGA chip. Background technique [0002] With the rapid development of integrated circuits, FPGA (Field-Programmable Gate Array, Field Programmable Gate Array) chip, as a programmable logic device, has gradually evolved from a peripheral device of electronic design to a digital system in just over 20 years. With the advancement of semiconductor process technology, the design technology of FPGA chips has achieved leap-forward development and breakthroughs, achieving the characteristics of high density, high security, low power consumption, low cost, system integration, and dynamic reconfigurability. Chips have been widely used in communications, aerospace, consumer electronics and other fields. In recent years, with the rapid development of some data processing services such as information technology...

AI Technical Summary

Problems solved by technology

[0003] However, while the ability of DSP to process data in the FPGA chip is getting stronger and stronger, the design of the DSP module in the FPGA chip is also becoming more and more complicated. The correctness of the function of the DSP module in the FPGA chip after tape-out will directly affect the performance of the FPGA chip. Therefore, how to quickly complete the functional test of all DSP modules in each FPGA chip under limited test conditions is particularly important. It is related to whether the rapid screening of FPGA chips can be completed and the performance of FPGA chips can be improved. Productivity

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