Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Smart card power failure test method

A power-off test and smart card technology, applied in the field of smart cards, can solve the problem of inability to detect whether the power-off protection mechanism is correct, and achieve the effect of comprehensive test coverage

Active Publication Date: 2020-11-27
EASTCOMPEACE TECH
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In view of this, the present invention provides a smart card power-off test method, which solves the problem that the existing single-command power-off test cannot detect whether the power-off protection mechanism is correct when the card performs data recovery

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Smart card power failure test method
  • Smart card power failure test method
  • Smart card power failure test method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0060] In order to enable those skilled in the art to better understand the technical solutions in the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described The embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0061] Please refer to figure 1 , a kind of smart card power-off testing method provided by the embodiment of the present invention, comprises the following steps:

[0062] S10: In the process of executing the transaction between the smart card and the reader-writer, cut off the power during the execution process of the write data inst...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an intelligent card poweroff testing method. The method includes: in the process when the intelligent card conducts a transaction with a reader-writer, powering off the execution process of record instruction updating; after the intelligent card is powered on and reset, judging whether record data in the intelligent card are updated or not in the transaction; if not, sequentially executing each instruction of the transaction, and powering off the execution process of a data writing instruction according to time set by a first poweroff timer when the data writing instruction is executed; wherein after the process of executing the data writing instruction is powered off each time, circularly executing following processes: when the intelligent card is powered on and reset again, sequentially executing each instruction of the transaction, and when executing a data recovery instruction, powering off the execution process of the data recovery instruction according totime set by a second poweroff timer, and stopping circulating until the data recovery instruction is executed successfully. By the method, the problem that existing single-instruction poweroff testingcannot detect whether a poweroff protection mechanism is correct or not when the card executes date recovery is solved.

Description

technical field [0001] The invention relates to the technical field of smart cards, in particular to a smart card power-off testing method. Background technique [0002] IC card (Integrated Circuit Card) is integrated circuit card, also known as smart card, microcircuit card or microchip card, etc. IC card is widely used in banks, Identity authentication, telecommunications, public transportation, parking lot management and other fields. [0003] In IC card applications, different cardholders have different card swiping habits, and it often happens that the IC card has left the strong area of ​​the workplace before the transaction is completed. For the non-contact interface swiping card transaction IC card, it relies on the induced current generated when the chip is in the working field strength area to provide working energy. Therefore, when the card leaves the working field strength area, the field strength disappears, which will cause the IC card to execute instructions ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/22G06F11/14
CPCG06F11/1448G06F11/2205G06F11/2273
Inventor 汤中泽赵莹莹刘奇张汉就袁外平韩贞张永林张六一
Owner EASTCOMPEACE TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products