Temperature-variable indexable micro-nano indention testing device

A test device, micro-nano technology, applied in the field of precision instruments, can solve problems such as the inability to realize nano-indentation test experiments, and achieve the effects of compact structure, promotion of development, and expansion of test range

Pending Publication Date: 2018-02-16
JILIN UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Existing indentation testing instruments at home and abroad can only achieve high temperature and low temperature temperature loading alone, and cannot realize nano-indentation testing experiments in high and low temperature continuously variable temperature environments. The testing environment has certain limitations, so the development of new indentation measuring instruments already urgent

Method used

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Embodiment Construction

[0025] The detailed content of the present invention and its specific implementation will be further described below in conjunction with the accompanying drawings.

[0026] see Figure 1 to Figure 8 As shown, the temperature-variable indexable micro-nano indentation test device of the present invention includes three parts: a table indexing base 1, a high and low temperature working chamber 2, and an indenter driving / feeding mechanism 3. The high and low temperature working chamber 2 is installed On the L-shaped mounting plate 112 of the table indexing base 1, the pressure head drive / feed mechanism 3 is installed on the equipment base 102 of the table indexing base 1; the table indexing base 1 is mainly used To realize the workbench indexing action and support the whole machine, the high and low temperature working chamber 2 can provide a continuously variable temperature environment for the test piece measurement process, and can isolate external interference. The indenter dr...

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Abstract

The invention relates to a temperature-variable indexable micro-nano indention testing device and belongs to the field of precise instruments. The device comprises a workbench indexing base, a high-and-low-temperature working cavity and an indenter driving / feeding mechanism, the high-and-low-temperature working cavity is mounted on an L-shaped mounting plate of the workbench indexing base, and theindenter driving / feeding mechanism is mounted on an equipment base of the workbench indexing base. The workbench indexing base is mainly used for indexing a workbench and supporting the whole device,the high-and-low-temperature working cavity can provide an environment atmosphere with temperature continuously changing for the process of test piece measuring and can isolate outside interference,and the indenter driving / feeding mechanism is mainly used for feeding an indenter in the vertical direction and acquiring measurement data through a pressure sensor and a displacement sensor. the device has the advantages that the device is accurate in measurement result, wide in measurement range and compact in structure, and the technical field of mechanical performance testing of materials anddevelopment of equipment for mechanical performance testing of the materials are promoted greatly.

Description

technical field [0001] The invention relates to the field of precision instruments, in particular to a temperature-variable indexable micro-nano indentation testing device. It is suitable for indentation testing of many materials such as metals, ceramics, polymers, semiconductors, special functional materials, and biological tissues. Under the environmental conditions of continuous temperature change, multiple sets of indentation tests can be carried out on different parts of the same specimen, and multiple sets of data can be measured to improve the accuracy of the measurement and the feasibility of the experiment; the high and low temperature working chamber passes the halogen lamp and the cooling probe Provide high temperature and low temperature ambient atmosphere for indentation test, which greatly improves the scope of application of the instrument. Background technique [0002] With the development of society and the advancement of science and technology, the demand ...

Claims

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Application Information

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IPC IPC(8): G01N3/54
CPCG01N3/54G01N2203/0682G01N2203/0676G01N2203/0228G01N2203/0226G01N2203/0082G01N2203/0051
Inventor 赵宏伟薛博然张世忠丁方胜谢英杰赵丹刘秋成孔令奇国磊王云艺王赵鑫李磊
Owner JILIN UNIV
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