Nonlinear delay dynamic system model intelligent identification method
A dynamic system model, nonlinear dynamic technology, applied in general control systems, control/regulation systems, instruments, etc., can solve the problems of instability, fluctuations in the model switching process, and high complexity of local linear model identification
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Embodiment 1
[0173] nonlinear plant Among them, d=12, ω(k) is a white noise signal with a signal-to-noise ratio of 14.35. The input signal u(k) is a random signal with amplitude [-0.5,0.5].
[0174] In the identification experiment, the number of data is n=550, and the Gaussian function width factor is set as (max(u(k))-min(u(k))) / (2*n), where k∈[1,550]. When the input delay order gradually increases from 1 to 20, we get figure 2 Enter a plot of lag order versus root mean square error. It can be obtained from the figure that when the input time-delay order is 12, the root mean square error is the smallest. According to the nonlinear system output correlation time-delay determination algorithm, the time-delay order of the nonlinear controlled object is 12, which is consistent with the real system The time lags are the same, which shows the effectiveness of the algorithm for determining the time lag of the output correlation system. After the time delay of the nonlinear system is deter...
Embodiment 2
[0180] The silicon single crystal growth and preparation process is a nonlinear complex process coupled with multiple fields, in which there are nonlinear and large hysteresis characteristics between the thermal field temperature and the crystal diameter, so the silicon single crystal thermal field temperature-crystal diameter link is regarded as an identification process. Figure 5 The data of thermal field temperature and crystal diameter at a certain time during the growth process of a silicon single crystal with a diameter of 208mm were prepared for the TDR150 single crystal furnace, and the data sampling interval was 10s. Since the magnitudes of the silicon single crystal thermal field temperature and crystal diameter sampling data are inconsistent, the data were normalized to the range [-1,1] respectively.
[0181] In the thermal field temperature-crystal diameter system delay determination experiment, the Gaussian function width factor is set as the input range of the co...
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