OLED driving film transistor parameter obtaining method
A technology for obtaining thin film transistors and parameters, applied in instruments, static indicators, etc., can solve problems such as parameter deviation of driving thin film transistors, and achieve the effect of improving compensation uniformity
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[0042] In order to further illustrate the technical means adopted by the present invention and its effects, the following describes in detail in conjunction with preferred embodiments of the present invention and accompanying drawings.
[0043] see figure 2 , the present invention provides a method for obtaining parameters of an OLED-driven thin film transistor, comprising the following steps:
[0044] Step S100, please refer to image 3 , providing an OLED pixel driving system, including: a sub-pixel driving circuit 10, and a sensing unit 20 electrically connected to the sub-pixel driving circuit 10; the sub-pixel driving circuit 10 includes: a first thin film transistor T1, a second thin film transistor T2, the third thin film transistor T3, the first capacitor C1, the second capacitor C2, the organic light emitting diode D1, and the switch S1; the gate of the first thin film transistor T1 is connected to the scanning signal Scan, and the source is electrically connected t...
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