A heating box control system and control cabinet for observing thermal deformation of piezoelectric devices

Abstract

The invention discloses a heating box control system for observing the thermal deformation of a piezoelectric device, and a control cabinet. The control system comprises a main switch which is configured to control the on / off of a first-stage temperature controller control signal circuit of a whole heating box. The first-stage temperature controller control signal circuit is configured to collecting the temperature of a central thermocouple in the heating box, and controls the on / off of two independent second-stage temperature controller control signal circuits connected with the first-stage temperature controller control signal circuit according to a collection value. Each second-stage temperature controller control signal circuit comprises a branch switch, an AC contactor circuit of a second-stage temperature controller and an AC contactor circuit of a heating plate, wherein the AC contactor circuits are controlled by the branch switch. Through the control of the connection of the two AC contactors, the system achieves the operation of the heating plate in the heating box or an object. Meanwhile, the signals of the thermocouples on the two heating plates are fed back to the corresponding second-stage temperature controllers, so as to feed back and adjust the heating temperature of the heating plates.

Description

technical field [0001] The invention relates to a heating box control system and a control cabinet for observing thermal deformation of piezoelectric devices. Background technique [0002] With the rapid development of science and technology, human beings have not only created huge material wealth in the traditional field, but also made great progress in the microscopic field. In recent years, ultra-precise smart micro / nano devices have gradually become the core technology of emerging industries such as information storage, precision machinery manufacturing, precision imaging, and semiconductor equipment. For example, the invention of the atomic force microscope provides us with a highly sensitive sensing device—the microcantilever. Therefore, a sensor using the micro-cantilever beam as a sensing element can be constructed, and has broad application prospects in the fields of automobile, aerospace, medicine, biology, chemistry, environmental protection, military affairs and...

AI Technical Summary

Problems solved by technology

[0005] Compared with the traditional heating box control cabinet and control system, it can neither accurately control the heating temperature of the heating plate or heating elements, thereby controlling the heating rate, nor can it accurately monitor the temperature of the accessories of the tested components, and cannot accurately complete the research on piezoelectric laminated beams Or other temperature field control when the device under test is deformed by heat

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