Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Small integrated YTF non-linear characteristic testing system and method

A characteristic testing, nonlinear technology, applied in RF circuit testing, electronic circuit testing, etc., to achieve the effect of reducing volume cost, accurate nonlinear characteristics, and reducing complexity

Active Publication Date: 2017-10-10
南京南环自动化技术有限公司
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to provide a small-scale integrated YTF nonlinear characteristic testing system and method to solve the problem of measuring the YTF nonlinear characteristic without relying on other external instruments and equipment

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Small integrated YTF non-linear characteristic testing system and method
  • Small integrated YTF non-linear characteristic testing system and method
  • Small integrated YTF non-linear characteristic testing system and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0030] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0031] The invention discloses a small-scale integrated YTF nonlinear characteristic testing system, such as image 3 As shown, including PC 1, PC 1 is connected to processor 2, PC 1 is connected to processor 2 through a serial port, which can facilitate operation and data transmission, and processor 2 sequentially passes through digital-to-analog conversion module 3, voltage-current converter 4 is connected to the first input terminal of the YIG tuning filter 9 (ie YTF).

[0032] The processor 2 is also connected to the input end of the first radio frequency switch 11 through the broadband signal generator 12, the output end of the first radio frequency switch 11 is connected to the input end of the second radio frequency switch 10, and the first output end of the second radio frequency switch 10 It is connected to the second input terminal...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a small integrated YTF non-linear characteristic testing system and method. The mall integrated YTF non-linear characteristic testing system includes a PC machine connected to a processor, the processor is connected to a YIG tuned filter through a digital-to-analogue conversion module and a current-to-voltage conversion module in sequence, the processor is further connected to a first radio-frequency switch through a broadband signal generator, the first radio-frequency switch is connected to a second radio-frequency switch which is connected to the YIG tuned filter, and the second radio-frequency switch is further connected to a third radio-frequency switch; the output end of the YIG tuned filter is connected with the third radio-frequency switch which is connected to a broadband signal electrical-level detection module, and the broadband signal electrical-level detection module is connected to the processor through the digital-to-analogue conversion module. Compared with a traditional testing method, the system greatly reduces the complexity and does not rely on other external instruments or equipment any more, the volume cost is greatly reduced, and actual tests show that the system can accurately extract non-linear characteristics of a YTF.

Description

【Technical field】 [0001] The invention belongs to the technical field of testing instruments, in particular to a small-scale integrated YTF nonlinear characteristic testing system and method. 【Background technique】 [0002] In radio frequency and microwave communication and test systems, various filters are needed to filter out unwanted frequency bands and various interferences. The role of the filter is very important. According to its working frequency band, it can be roughly divided into several categories: lumped device filter, distributed parameter filter, cavity filter, dielectric filter and so on. The application frequency band of the lumped device filter is limited, and it can hardly be applied above 10GHz. It is difficult to improve the performance index (insertion loss, stop band rejection) of the distributed parameter filter, and it is difficult to make the cavity filter and dielectric filter large The adjustable range, usually its adjustable range is less than 3...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/2822
Inventor 王静
Owner 南京南环自动化技术有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com