ICE automated test system and test method

A technology for automated testing and testing systems, applied in software testing/debugging, design optimization/simulation, error detection/correction, etc. It can solve problems such as wasting resources and costs, affecting the efficiency of testing, and failing to record ICE, and achieve chip repair Design, convenient and quick to find problems, reduce the effect of manual operation

Active Publication Date: 2017-05-10
CHIPSEA TECH SHENZHEN CO LTD
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  • Description
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AI Technical Summary

Problems solved by technology

However, the CS-SIM master module and the CS-SIM slave module do not record the ICE model and various application programs. For different ICE product tests, it is necessary to re-do all the test steps, which inevitably leads to waste of resources and costs. , affecting the efficiency of the test

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  • ICE automated test system and test method
  • ICE automated test system and test method
  • ICE automated test system and test method

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Embodiment Construction

[0035] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0036] figure 1 As shown, it is a schematic diagram of an ICE automated test system implemented by the present invention. In the figure, the test system includes two major parts, an upper computer and a lower computer, wherein:

[0037] The upper computer uses scripts as the central console of the test system, and stores the ICE model library, program case library (FC), TB case library, and test case library (TC).

[0038] The lower computer includes: DUT and TB test board, DUT is the hardware carrier of the program use case, TB acts as a test component such as a signal generator for the DUT input...

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Abstract

The invention discloses an ICE (In-Circuit Emulator) automated test system and an ICE automated test method. The test system comprises two major parts including an upper computer and a lower computer, wherein the upper computer uses a script as a central control board of the test system; the lower computer comprises a DUT (Device Under Test) and a TB (Test Board); and the upper computer communicates with the lower computer through an API (Application Programming Interface). According to the automated test system and method, digital function testing of all ICE supported models can be realized, labor input of testing is reduced, manual operation is reduced to a great extent, and a test process is greatly shortened; and a test log is automatically output, so that test personnel can quickly discover problems and repair chip design.

Description

technical field [0001] The invention belongs to the technical field of automatic testing, in particular to an automatic testing system and method for an on-line emulator based on a field programmable array. Background technique [0002] An in-circuit emulator (ICE), also known as a hardware emulator, is a physical device equivalent to a chip used in the MCU development process. The characteristics of its products are to strictly approximate the functional characteristics, electrical characteristics and physical characteristics of real chips. Using the device and its supporting IDE development environment, users can quickly perform embedded programming, cross-compilation, real-time simulation debugging, etc. Such devices generally have reconfigurable characteristics, that is, an ICE can usually simulate the characteristics of multiple MCU chips. [0003] However, with more and more chip types compatible with ICE, product testing has become an extremely heavy workload. Beca...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36G06F17/50
CPCG06F11/3652G06F30/20
Inventor 周乾江黄志宇秦晨钟谢韶波
Owner CHIPSEA TECH SHENZHEN CO LTD
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