Integrated circuit interconnection reliability analysis method for modeling based on neural network parameters
A neural network model and neural network technology, applied in the field of reliability modeling of integrated circuit interconnection, can solve problems such as long simulation time, and achieve the effect of improving efficiency
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0029] The technical solution of the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments, and the described specific embodiments are only for explaining the present invention, and are not intended to limit the present invention.
[0030] In order to overcome the time-consuming problem of finite element simulation in interconnection reliability analysis, the present invention applies the neural network modeling method to simulation analysis of integrated circuit interconnection reliability, which can overcome the shortcoming of long simulation time of traditional ANSYS software. The neural network is optimized through a learning method (training) based on mathematical statistics. It is often used to model the relationship between input and output with high linearity, and the relationship between input and output is expressed by a statistical method with a function.
[0031] The invention proposes an int...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com