Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Convolution and superposition dose calculation method based on Monte Carlo photon simulation

A calculation method and photon technology, applied in dosimeters and other directions, can solve the problem of inaccurate simulated photon flux, and achieve the effect of improving accuracy and ensuring speed.

Active Publication Date: 2016-12-07
HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
View PDF5 Cites 16 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to: overcome the inaccurate simulation of photon flux in the non-uniform region in the traditional photon convolution superposition dose calculation method and the time-consuming shortcomings of the traditional Monte Carlo method for simulating electron transport, and provide a method based on Monte Carlo photon The simulated convolution superposition dose calculation method can not only obtain higher precision, but also effectively improve the calculation speed

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Convolution and superposition dose calculation method based on Monte Carlo photon simulation
  • Convolution and superposition dose calculation method based on Monte Carlo photon simulation
  • Convolution and superposition dose calculation method based on Monte Carlo photon simulation

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0029] like figure 1 As shown, the present invention includes the following contents:

[0030] The energy spectrum information of the radioactive source is obtained through the developed energy spectrum inversion method (Li Gui, Zheng Huaqing, Lan Haiyang, Meng Yao, Song Gang, Wu Yican. Based on the multi-algorithm radioactive source inversion method, patent number: ZL200910116116.0) ;

[0031] Using a Monte Carlo program, such as the subroutine EDKnrc of EGSnrc, etc., the energy deposition point kernel Π obtained: Π is a series of photons of single energy or a certain energy spectrum incident into a uniform medium (such as water), corresponding to the three-dimensional The radiation energy value matrix of coordinates (x, y, z) is obtained through the developed point kernel method (Zheng Huaqing, Song Gang, Li Gui, Meng Yao, Lan Haiyang, Wu Yican. An analytical Monte Carlo dose calculation method, patent No.: ZL200910116115.6) obtained;

[0032] According to the irradiation...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a convolution and superposition dose calculation method based on Monte Carlo photon simulation. The original analysis photon flux calculation is replaced by using Monte Carlo photon transportation on the basis of the conventional photon dose calculation model; and electron transportation is replaced by using the pre-calculated energy deposition nuclear so that time of simulation calculation can be greatly reduced in comparison with full space Monte Carlo photon-electron coupling transportation. Different calculation strategies can be used according to different calculation areas for further accelerating calculation speed; and convolution and superposition calculation is performed point by point as for the calculation points of the areas of interest, only a part of specific points are calculated as for calculation points of other areas and dose information of any point is obtained through the method of interpolation so that the calculation accuracy of the concerned areas of users can be guaranteed and calculation time can be reduced.

Description

technical field [0001] The invention relates to a convolution superposition dose calculation method based on Monte Carlo photon simulation, which belongs to the field of radiation dose calculation in the fields of nuclear physics, nuclear technology application and the like. Background technique [0002] Radiation dose measurement and calculation are widely used in environmental protection, radiation chemical industry, food processing, nuclear technology and application, aerospace and other fields. Among them, the speed and accuracy of the dose calculation method are the key issues in the radiation dose calculation. [0003] Dose calculation methods are generally divided into analytical methods and Monte Carlo methods. Analytical methods have the advantages of fast speed and high accuracy in uniform areas, but there are large errors in non-uniform areas of tissue; Monte Carlo methods simulate the transport process of particles in the medium, which can be accurate without ge...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01T1/02
CPCG01T1/02
Inventor 郑华庆吴宜灿胡丽琴宋婧孙光耀
Owner HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com