Chip resistor impedance and standing-wave ratio frequency characteristic measuring device and method
A technology for measuring devices and resistors, which is applied in the field of radio frequency microwaves, can solve the problems of insufficient connection compactness between microwave measuring fixtures and chip resistors, high precision requirements for microwave fixture components, and high manufacturing process requirements, so as to achieve reliable measurement results and reduce The effect of parasitic inductance and accurate input impedance
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment
[0028] The measurement method of the present invention uses two circuits, one is a microstrip line circuit with a terminal loading resistance, and the other is a microstrip line circuit with a terminal short circuit. Microstrip line circuit with terminal loading resistance: chip resistors are connected to the end of the microstrip line, and the resistance value of the chip resistors greater than 50Ω is as close as possible to 50Ω in parallel, and the chip resistors are placed at equal intervals at the end of the microstrip line ; For chip resistors less than 50Ω, do not do connection processing, directly place a resistor in the middle of the end of the microstrip line. Microstrip line circuit with terminal short-circuit: the microstrip line should be equal in length and width to the microstrip line of the terminal loading resistor, and the end of the microstrip line is connected to a small microstrip line that is consistent with the total length and width of the terminal loadin...
PUM
Property | Measurement | Unit |
---|---|---|
Characteristic impedance | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com