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X-ray diffraction back-pressurizing penetration sample board capable of reducing preferred orientation

A technology of preferred orientation and sample plate, applied in material analysis using radiation diffraction, material analysis using wave/particle radiation, measuring devices, etc., can solve problems such as cumbersome back pressure method, sample sinking, sample preparation failure, etc. Achieve accurate X-ray diffraction patterns and test results, simple and convenient sample preparation, and reduce errors

Inactive Publication Date: 2016-11-16
TONGJI UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, when using an ordinary transparent sample plate, the back pressure method is usually cumbersome. Generally, the glass slide and the transparent sample plate are clamped together with a clip, and the sample is put into the sample plate and scraped flat, and then sealed with tape. OK, turn the sample plate over with the glass slide again, remove the clamp and slide glass
The whole process is cumbersome, and prone to mistakes that lead to sample preparation failure; due to the action of gravity, the sample will also sink, resulting in errors in test results

Method used

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  • X-ray diffraction back-pressurizing penetration sample board capable of reducing preferred orientation
  • X-ray diffraction back-pressurizing penetration sample board capable of reducing preferred orientation
  • X-ray diffraction back-pressurizing penetration sample board capable of reducing preferred orientation

Examples

Experimental program
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Effect test

Embodiment

[0012] Embodiment 1: As shown in Figure 1, the device is composed of a permeable sample plate 2 and two object slides. The sample plate 2 has a sample hole, and its two sides are covered with magnetic substances, which can hold iron non-stick The two slides are firmly sucked on the sample plate 2; the first slide 1 and the second slide 3 are made of iron, and the surface is coated with anti-sticking substances after polishing to prevent the powder sample from sticking to the slide. When preparing the sample, suck the first slide 1 on the front of the sample plate 2, turn over the sample plate 2, put the powder sample in the sample hole, suck the second slide 3 on the back, and place the sample The sample plate 2 is righted up, and the first slide 1 sucked on the front of the sample plate 2 is removed, and the test can be carried out. When adopting the sample preparation through the sample plate proposed by the present invention, auxiliary articles such as clips and adhesive ta...

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PUM

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Abstract

The invention relates to an X-ray diffraction back pressure method that can reduce the preferred orientation through the sample plate, which is composed of a sample plate and a loading sheet. material, the loading piece is made of iron material, and the loading piece can be pasted on the sample plate through the magnetic substance on the sample plate; the front and back sides of the loading piece are polished, and the surface is coated with an anti-sticking substance to prevent the powder sample from sticking on slides. When preparing samples, a piece of loading piece is sucked on the front of the sample plate through a magnetic substance, the sample plate is turned over, and then the powder sample is installed in the sample hole, and then another piece of loading piece is sucked on the back of the sample plate, and the sample plate is turned over. The sample plate is righted, and finally a piece of loading piece sucked on the front of the sample plate is removed, and the test can be carried out. The invention can significantly reduce the preferred orientation generated in the surface area of ​​the sample, thereby reducing the error caused by the change of the relative intensity of the diffraction lines, and obtaining more accurate X-ray diffraction patterns and test results.

Description

technical field [0001] The invention relates to an X-ray diffraction back pressure method which can reduce the preferential orientation through a sample plate. technical background [0002] X-ray diffractometer uses the principle of X-ray diffraction to accurately measure the crystal type, structure, texture and stress of substances, and accurately perform phase analysis, qualitative analysis and quantitative analysis. Widely used in metallurgy, petroleum, chemical industry, scientific research, aerospace, teaching, material production and other fields. The sample plate is one of the important accessories of the X-ray diffractometer, which has a direct impact on the test results. [0003] The commonly used X-ray diffractometer sample preparation methods are difficult to avoid a certain degree of preferred orientation of surface grains on the sample plane, and the existence of preferred orientation seriously affects the correct measurement of diffraction line intensity. Whe...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/20
CPCG01N23/2005G01N2223/312
Inventor 于龙杨正宏孙振平李好新
Owner TONGJI UNIV
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