Long-time low-drift integrator and control method thereof

Abstract

The invention provides a long-time low-drift integrator and a control method thereof. The long-time low-drift integrator comprises a temperature control module, an integration module, a semiconductor refrigerator, and a temperature detection sensor. The temperature control module is connected with the semiconductor refrigerator. The integration module and the temperature detection sensor are arranged on a controlled temperature surface of the semiconductor refrigerator. The temperature detection sensor is connected with the temperature control module. The temperature control module is used for controlling and stabilizing the temperature of the semiconductor refrigerator. The integration module realizes integral zero compensation. The long-time low-drift integrator can be stabilized at a controlled temperature point in a short time, the surge current of the semiconductor refrigerator is eliminated, and fluctuation of stable temperature is small. The temperature control module makes temperature-sensitive devices in the integration module work at a constant temperature, integral drift caused by parameter change of the devices is reduced, nonlinear drift can be reduced effectively, temperature control is stable, and the long-time integral drift is small.

Description

technical field [0001] The invention relates to an integrator, in particular to a long-time low-drift integrator and a control method for the long-time low-drift integrator. Background technique [0002] The induction coil is simple to make, low in cost, and durable, and is often used as a magnetic detection sensor. In a tokamak device, the induction coil is combined with an integrator to detect magnetic signals. In the field of non-destructive testing, the combination of induction coils and integrators obtains magnetic flux constructed of ferromagnetic materials for non-destructive testing. With the prolongation of the plasma discharge time in the tokamak device and the increase of the measured build length, it is required that the integrator can maintain a stable output with low drift for a long time. [0003] The non-ideality of the operational amplifier used for the integrator itself, the input offset voltage V OS , Input offset current I OS and the input bias current...

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Problems solved by technology

[0003] The non-ideality of the operational amplifier used for the integrator itself, the input offset voltage V OS , Input offset current I OS and the input bias current I IB The linear drift of the integral output is caused; the dielectric loss of the integral capacitor and the leakage resistance and the input resistance of the op amp are not ideal and infinite, which provides a discharge path for the integral capacitor, causing the nonlinear drift of the integral output; the temperature change causes the integrator V OS , I OS , I IB The change further increases the nonlinear drift of the integrator; the leakage current on the circuit board is easily injected into the operational amplifier through the input pin to increase the nonlinear drift of the integration; therefore, for the design of the long-time low-drift integration system, it is necessary Compensate for these drifts and overcome

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