A DC bias characteristic test circuit and test method of a capacitor

Abstract

The invention discloses a DC bias feature test circuit and test circuit of a capacitor. The circuit comprises a DC voltage-stabilizing power supply, a test instrument, a first capacitor, a second capacitor, a first switch and a second switch, wherein the first capacitor and the second capacitor are connected in parallel, one end of the DC voltage-stabilizing power supply is connected with one end of the first capacitor and one end of the second capacitor, the other end of the DC voltage-stabilizing power supply is connected with the other end of the first capacitor through the first switch, the other end of the first capacitor is connected with the other end of the second capacitor through the second switch, the test instrument is connected with the two ends of the second switch, and the first capacitor is a capacitor to be tested; and the second capacitor is a capacitor to be tested which has the same structure and performance as the first capacitor or a voltage source with known impedance or a capacitor with known parameters. According to the invention, the problem of testing a capacitor load under DC bias is overcome, measured capacitance data of the DC bias in a high-frequency circuit is particularly accurate and effect, and the measured data does not need complex operation.

Description

technical field [0001] The invention relates to the field of electronic technology, in particular to a DC bias characteristic testing circuit and testing method of a capacitor. Background technique [0002] Capacitors often have a certain DC voltage bias in actual operation, and the capacitance characteristics often change under DC voltage bias, including capacitance value, capacitance equivalent series resistance and capacitance equivalent series inductance. At this time, it is not accurate and complete to use the measured capacitance characteristic parameters to characterize the capacitance characteristics under the DC voltage bias when it is static, that is, when there is no DC voltage bias. [0003] The existing technology is mainly aimed at the static characteristics of the capacitor and the characteristic test under the AC load, and fails to realize the accurate measurement of the capacitor characteristic under the DC bias voltage. In the actual circuit, whether it is...

AI Technical Summary

Problems solved by technology

The commonly used impedance analyzer or LCR meter is a precision instrument. During the test, there must be no potential difference between the two ends of the device under test, otherwise it is easy to burn out the instrument.

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