A Life Prediction Method for Fatigue Crack Growth of Metal Structures Based on Taylor's Perturbation Series Method
A technology of fatigue crack growth and crack growth, which is applied in the direction of electrical digital data processing, special data processing applications, instruments, etc., and can solve problems such as errors in initial crack measurement results and manufacturing errors
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment
[0093] In order to understand more fully the characteristics of this invention and its applicability to engineering practice, the present invention uses image 3 The shown 475-T761 aerospace aluminum alloy center crack (MT) specimen was taken as an example to verify the crack growth fatigue life prediction. The MT sample is 75mm wide and 2.5mm thick, with a central crack, such as image 3 shown. The frequency of the applied load is 10Hz, and the length of the prefabricated half-crack is a 0 = 4mm, due to manufacturing errors, the actual initial half-crack length is a 0 =4.06mm, the half-crack length a and the corresponding number of load cycles N are shown in Table 1.
[0094] Table 1a-N test data points
[0095]
[0096] According to formula (5), calculate the tangent slope of each discrete point, and through regression analysis, the parameter value in the crack propagation equation (4) is obtained: Q=3.9547×10 -8 , b=3.3794. The initial half-crack length is a(0)=4.0...
PUM
Property | Measurement | Unit |
---|---|---|
critical crack length | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com