Image Sensor Column Delay Caused Image Distortion Recovery Method

Abstract

The present invention relates to the field of analog integrated circuit design. In order to enable the linear array image sensor to better realize the function of high-speed and high-resolution image acquisition, improve the line frequency of the linear array image sensor, and expand the application range of the linear array image sensor, the present invention adopts The technical solution is that the image sensor column delay causes the image distortion restoration method, comprising the following steps: 1) calculating the maximum distortion distance L along the cross-track direction: 2) calculating the deformation and distortion angle α of the captured image: the deformation and distortion angle α passes through the formation Calculate the linear array length of the image sensor as W and the maximum distortion distance along the cross-track direction as L: 3) Restore the captured image according to the deformation distortion angle α. The invention is mainly applied to image processing.

Description

technical field [0001] The invention relates to the field of analog integrated circuit design, in particular to the design of an imaging calibration circuit for a high-speed long line array image sensor. Specifically, it relates to a recovery method for image distortion caused by image sensor column delay. Background technique [0002] The image sensor can convert the optical signal obtained by the lens into an electrical signal that is easy to store, transmit and process. According to the pixel arrangement structure in the solid-state image sensor chip, the image sensor can be divided into an area array image sensor and a line array image sensor. [0003] The area array image sensor directly captures the object through the pixels arranged in the form of a two-dimensional area array to obtain two-dimensional image information. Each exposure of the area array image sensor can obtain a complete frame of image, which can easily obtain two-dimensional image information, but th...

AI Technical Summary

Problems solved by technology

For a long line array image sensor, the same number of clock tree paths as the number of pixels is required, which will consume more chip area. For a Time Delay Integration (TDI) image sensor using line array technology, each pixel The gap between them is so narrow that this clock routing is not achievable

And there will be a large coupling capacitance between the metal lines, which will affect the surrounding circuits

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