Chip testing method
A chip testing, chip technology, applied in the direction of single semiconductor device testing, measuring electricity, measuring devices, etc., can solve the problem of chip heating, etc., to achieve the effect of increasing temperature, simple method, and easy to use
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[0028] The above and other technical features and advantages of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Apparently, the described embodiments are only some of the embodiments of the present invention, not all of them.
[0029] Please refer to 1, the chip testing method provided by Embodiment 1 of the present invention is used to test the temperature-related test items of the chip in the mid-test or final test process of the chip, including the following steps:
[0030] S100. Apply voltage or current to the power device inside the chip to be tested, and control the temperature of the chip to be tested by adjusting the magnitude of the applied voltage or current and the corresponding application time, so that the temperature of the chip to be tested reaches a preset temperature temperature;
[0031] S200. After the temperature of the chip to be tested reaches a preset temperature, test the temperature-re...
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