Wide-spectrum quantum cascade infrared detector
An infrared detector and quantum cascade technology, which is applied in the field of infrared detectors, can solve the problems of device detection rate decrease, dark current increase, etc., and achieve the effect of quantum efficiency improvement, accurate output and reading
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example 1
[0030] (1) Growth of thin film materials for multiple quantum well chips:
[0031] The following structure is sequentially grown on the GaAs substrate 1 by molecular number epitaxy (MBE), C 1 For GaAs:Si, the concentration is 10 18 / cm 3 , with a thickness of 0.5 μm; L 1 for Al 0.33 Ga 0.67 As, 40nm thick; QW 1 For GaAs:Si, the concentration is 10 17 / cm 3 , with a thickness of 6.8nm; L 1 ’ for Al 0.33 Ga 0.67 As, 3nm thick; QW 2 For GaAs:Si, the concentration is 10 17 / cm 3 , with a thickness of 6.8nm; L 2 ’ for Al 0.33 Ga 0.67 As, with a thickness of 5.65nm; QW 3 For GaAs, the thickness is 2nm; L 3 ’ for Al 0.33 Ga 0.67 As, with a thickness of 3.96nm; QW 4 For GaAs, the thickness is 2.3nm; L 4 ’ for Al 0.33 Ga 0.67 As, with a thickness of 3.1nm; QW 5 For GaAs, the thickness is 2.8nm; L 5 ’ for Al 0.33 Ga 0.67 As, with a thickness of 3.1nm; QW 6 For GaAs, the thickness is 3.4nm; L 6 ’ for Al 0.33 Ga 0.67 As, with a thickness of 3.1nm; QW 7For G...
example 2
[0038] (1) Growth of thin film materials for multiple quantum well chips:
[0039] The following structure is sequentially grown on the GaAs substrate 1 by molecular number epitaxy (MBE), C 1 For GaAs:Si, the concentration is 10 18 / cm 3 , with a thickness of 0.7 μm; L 1 for Al 0.32 Ga 0.68 As, 50nm thick; QW 1 For GaAs:Si, the concentration is 10 17 / cm 3 , with a thickness of 6.9nm; L 1 ’ for Al 0.32 Ga 0.68 As, 4nm thick; QW 2 For GaAs:Si, the concentration is 10 17 / cm 3 , with a thickness of 6.9nm; L 2 ’ for Al 0.32 Ga 0.68 As, with a thickness of 5.8nm; QW 3 For GaAs, the thickness is 2.2nm; L 3 ’ for Al 0.32 Ga 0.68 As, with a thickness of 4.1nm; QW 4 For GaAs, the thickness is 2.5nm; L 4 ’ for Al 0.32 Ga 0.68 As, with a thickness of 3.3nm; QW 5 For GaAs, the thickness is 3nm; L 5 ’ for Al 0.32 Ga 0.68 As, with a thickness of 3.3nm; QW 6 For GaAs, the thickness is 3.5nm; L 6 ’ for Al 0.32 Ga 0.68 As, with a thickness of 3.3nm; QW 7 For Ga...
example 3
[0046] (1) Growth of thin film materials for multiple quantum well chips:
[0047] The following structure is sequentially grown on the GaAs substrate 1 by molecular number epitaxy (MBE), C 1 For GaAs:Si, the concentration is 10 18 / cm 3 , with a thickness of 1 μm; L 1 for Al 0.31 Ga 0.69 As, 60nm thick; QW 1 For GaAs:Si, the concentration is 10 17 / cm 3 , with a thickness of 7nm; L 1 ’ for Al 0.31 Ga 0.69 As, with a thickness of 3.5nm; QW 2 For GaAs:Si, the concentration is 10 17 / cm 3 , with a thickness of 7nm; L 2 ’ for Al 0.31 Ga 0.69 As, 6nm thick; QW 3 For GaAs, the thickness is 2.4nm; L 3 ’ for Al 0.31 Ga 0.69 As, with a thickness of 4.3nm; QW 4 For GaAs, the thickness is 2.7nm; L 4 ’ for Al 0.31 Ga 0.69 As, with a thickness of 3.5nm; QW 5 For GaAs, the thickness is 3.2nm; L 5 ’ for Al 0.31 Ga 0.69 As, with a thickness of 3.5nm; QW 6 For GaAs, the thickness is 3.7nm; L 6 ’ for Al 0.31 Ga 0.69 As, with a thickness of 3.5nm; QW 7 For GaAs, ...
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