Reliability acceleration test method of electronic products

Abstract

The invention discloses a reliability acceleration test method of electronic products, and belongs to the field of reliability designing and testing. The method comprises steps of firstly presetting an acceleration test temperature change curve boundary according to working stress limit obtained via a routine test for reliability of an electronic product, carrying out simulating calculation of temperature acceleration factors, and modifying and determining initial acceleration test temperature stress change curves; and secondly, calculating vibration acceleration factors according to the initial acceleration test temperature stress change curves and a test profile of the routine test for the reliability of the original electronic product, calculating acceleration test vibration stress change curves according to the vibration acceleration factors, and according to the acceleration test vibration stress change curves, determining the final temperature stress change curves and determining acceleration test time. According to the invention, by following the thought of testing and examining working stress of a product and properly increasing test stress level, test time is shortened; a reliability test of the electronic product can be accelerated; and diversity and controllability of the acceleration factors are achieved.

Description

technical field [0001] The invention belongs to the field of reliability test and design, and in particular relates to a reliability accelerated test method for electronic products. Background technique [0002] The traditional reliability statistical test method and evaluation technology based on environmental simulation can no longer meet the needs of equipment development with high reliability requirements, fast replacement speed, and short development cycle. The increasingly accelerated development of electronic equipment also urgently requires high-efficiency reliability tests. With the support of technology, the reliability level of electronic products is getting higher and higher. The indicators of many products have exceeded 3000 hours. The traditional reliability environment simulation test is far from meeting the requirements of modern aircraft system development. In order to effectively solve the contradiction between the reliability and complexity of modern elect...

AI Technical Summary

Problems solved by technology

Obviously, according to the traditional concept of reliability, failures occur randomly, and the root cause and acceleration relationship cannot be traced, so it is impossible to conduct accelerated experiments

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