Analyzer for metal oxide film

Abstract

The invention aims at solving the problems that a silicon steel plate surface oxide layer is long in detection period and investment cost is high, and provides analysis equipment which is based on a primary battery principle and is capable of performing rapid determination on the metal oxide layer. The analysis equipment comprises a potentiometer, a copper guide rod, a cover plate, an acid tank, a water tank, a constant-temperature magnetic stirrer and a porous baffle plate; the constant-temperature magnetic stirrer controls the electrolyte solution temperature stability and concentration uniformity; the copper guide rod is a specially-prepared connecting guide rod, is fixedly disposed on the multifunctional cover plate and is capable of realizing positioning and adjusting of conduction current and a polar plate; and the porous baffle plate is capable of effectively blocking eddy current and guaranteeing the measure stability. The provided equipment is low in cost, low in measure cost, simple to operate and good in measure stability, and is capable of realizing macroscopic rapid measure on the metal oxide film. A figure (5) is the result graphic representation of the apparatus provided by the invention measuring the oriented silicon steel surface oxide layer.

Description

Technical field: [0001] The invention relates to a material analysis device, in particular to a metal oxide film analyzer. Background technique: [0002] Oriented silicon steel is widely used in industry, but in the production of oriented silicon steel, there may be surface quality defects and other adverse problems, such as dew crystals, gold leakage, mottle, low interlayer resistance, etc. Surface quality problems will increase the yield rate of the bottom layer on the one hand, On the other hand, the iron loss is increased, and the image of the product is also damaged. The quality of the oxide layer formed by decarburization annealing has a decisive impact on the final surface quality, but it takes about several weeks from decarburization annealing to the discovery of surface quality problems after the final coating of the insulating layer, and then to analyzing the problem and finding a solution. A large number of products with poor surface quality will be produced for ...

AI Technical Summary

Problems solved by technology

[0002] Oriented silicon steel is widely used in industry, but in the production of oriented silicon steel, there may be surface quality defects and other adverse problems, such as dew crystals, gold leakage, mottle, low interlayer resistance, etc. Surface quality problems will increase the yield rate of the bottom layer on the one hand, On the other hand, the iron loss is increased, and the image of the product is also damaged

The advantage of these methods is that they can carry out detailed qualitative and quantitative analysis on the composition, morphology and structure of the oxide layer, so they are especially suitable for scientific research, but these analysis methods have long analysis periods, small analysis areas, and high equipment investment and detection costs. , not suitable for long-term, continuous, large-scale macroscopic detection in industrial production

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