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Method and device for measuring freezing parameters of frozen meat

A technology for frozen meat and parameters, applied in measuring devices, material analysis through optical means, instruments, etc., can solve the problems of lack of systematic research on the relationship between sample spectrum and temperature changes, no freezing process or rapid detection of frozen products, etc., to achieve method fast effect

Active Publication Date: 2015-12-09
SOUTH CHINA UNIV OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, there is a lack of systematic research on the relationship between sample spectra and temperature changes
At present, there are no reports on the rapid detection of freezing process or frozen products based on spectroscopic technology

Method used

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  • Method and device for measuring freezing parameters of frozen meat
  • Method and device for measuring freezing parameters of frozen meat
  • Method and device for measuring freezing parameters of frozen meat

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0034] The device for measuring the freezing parameters of frozen meat in this embodiment is as follows: figure 1 As shown, including lens 1, near-infrared spectrometer 2 (Finland ImSpectorN17E, Specim, Oulu, Finland wavelength 900-2500nm, wavelength resolution is 6nm) and CCD camera 3 (Belgium XEVA992, XC130Xenics, Leuven, Belgium pixel is 320×300) , two 500W light sources 4 (LowelV-light TM , NY, USA), a stage 5 (IRCP0076-1COMB, Isuzu Optics Co., Taiwan, China) and a computer 8 . The difference from ordinary hyperspectral systems is that a small refrigerator 6 (FYL-YS-30L, FuyilianCo., Beijing, China) is placed on the stage, and the upper cover of the refrigerator is 0.5cm thick, which can better transmit near-infrared The quartz flat glass of the spectrum, the frozen meat sample 7 is placed in the refrigerator 6 .

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PUM

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Abstract

The invention discloses a method for measuring freezing parameters of frozen meat; with utilization of difference of near infrared absorption and reflection spectra of different-particle-size and different-distribution ice crystals formed from moisture in a product in different temperatures and at different freezing rates, and through establishment of a chemometrics relationship model of the freezing parameters and the near infrared spectra, the method for rapidly measuring the freezing temperature and the freezing rate of the frozen product is realized. The method can rapidly, accurately and nondestructively measure the freezing temperature and rate, at the same time, breaks through conventional technical limitations that the freezing parameters of the product are required to be in the freezing process to be measured, and is applicable to monitoring and quality analysis of the freezing process of the frozen product.

Description

technical field [0001] The invention relates to a detection method for the quality of frozen products, in particular to a method and device for measuring freezing parameters of frozen meat. Background technique [0002] Low temperature can slow down the growth of microorganisms and reduce the speed of biochemical reactions, so freezing technology is widely used in many fields. Many foods need to be refrigerated to extend their shelf life; freezing is also an important technology for preserving biological materials and medical organs, such as functional proteins, sperm, bone, cartilage, blood vessels, ovaries, testes, endocrine glands, etc. However, freezing and cold storage can also cause some damage to the sample, the extent of which varies depending on the freezing technique. Typically, snap freezing results in the formation of many very small ice crystals that are evenly distributed within the cell, causing minimal damage to the cellular structure and thus preserving the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/3563
Inventor 孙大文谢安国蒲洪彬曾新安
Owner SOUTH CHINA UNIV OF TECH
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