Method for evaluating surface defects of spherical optical components
A spherical optics and defect evaluation technology, applied in the direction of using optical devices, material analysis through optical means, scientific instruments, etc., can solve the problems of inability to give quantitative description of defect information, human eyes fatigue, etc., to improve detection efficiency and The effect of detection accuracy and reliable numerical basis
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Embodiment 1
[0054] Below, embodiment 1 of the present invention will use Figure 1-9 to describe in detail.
[0055] The method for evaluating the surface defect of a spherical optical element specifically includes the following steps:
[0056] Step 1. When the spherical optical element 201 is imaged on the image plane through micro-scattering dark field imaging, the obtained imaging sub-aperture image is a two-dimensional image. Since information compression along the optical axis of imaging occurs during the optical imaging process, three-dimensional reconstruction of the spherical surface must first be performed to correct the information compression along the optical axis of imaging caused by surface defects of the spherical optical element 201 through optical imaging.
[0057] Step 2. The three-dimensional sub-aperture image is obtained after three-dimensional reconstruction of the spherical surface. In order to facilitate feature extraction, the information of the three-dimensional...
Embodiment 2
[0095] Below, embodiment 2 of the present invention will combine Figure 10 to describe in detail. In Example 2, a method of evaluating a surface defect of a spherical optical element when evaluating a small-diameter spherical optical element will be described.
[0096] The characteristic of the small-aperture spherical optical element 1801 discussed in this embodiment is that it only needs to perform micro-scattering dark-field imaging on a sub-aperture at the vertex of the sphere to obtain full-aperture imaging of the entire surface of the small-aperture spherical optical element. Therefore, the corresponding defect evaluation method is also simpler than that in Embodiment 1, and the spherical defect information can be obtained by processing the sub-aperture image through image processing and defect calibration.
[0097] The sub-aperture image is processed through image processing and defect calibration to obtain spherical defect information, see Figure 10 , including the...
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