On-chip antenna test device

Abstract

The invention provides an on-chip antenna test device. An adjusting mechanism is arranged on a probe bench pedestal and is formed by X, Y, and Z mobile platforms. Antennas on an antenna chip-bearing bench are precisely positioned via a CCD telescope and the adjusting mechanism. A probe support performs feeding for the on-chip antennas. Via the rotation of a low-position axis and a polarization axis, matching for polarization of a receiving antenna and an emission antenna is performed. If the polarization of the receiving and emission antennas is matched, full-directional data acquisition in 0-360 DEG is performed via a rotation shaft. In the low-direction axis, a direct-current servo motor drives a synchronous tooth belt wheel which drives a turbine worm. The turbine worm drives a straight gear which drives a sliding guide rail. According to the invention, a feeding problem of the antennas is solved; the test device is provided with front and back testing ability of the antenna; effects of interference on antennas of a traditional bench body are reduced; and testing functions of holographic stereoscopic directional diagram of a to-be-tested antenna is achieved.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to an on-chip antenna testing device. Background technique [0002] Modern antenna measurement is based on computer applications, mainly including far-field measurement, near-field measurement, and compact field measurement, including antenna principles, mechanical control, high-performance instruments, computer software, and data processing. , Efficiency, intelligence and automation are the general trend of antenna measurement technology development. [0003] The antenna far-field measurement refers to directly obtaining the far-field performance parameters of the antenna in the radiation far-field area of ​​the antenna. In general, the antenna far-field test distance R needs to satisfy R≥2D 2 / λ, D is the maximum size of the antenna aperture, and λ is the working wavelength of the antenna. The traditional far-field antenna test device is mainly a test turntable. According to th...

AI Technical Summary

Problems solved by technology

[0007] At present, with the development of antenna technology, a type of probe-fed on-chip antenna has emerged. With the rapid development of wireless communication, the current test requirements for on-chip antennas are becoming increasingly urgent. Due to the different feeding methods of on-chip antennas, especially In the millimeter wave frequency band, the feed interface is changed from the traditional coaxial waveguide feed to the GSG probe feed, and because the interface size is very small, it must cooperate with CCD and high-precision adjustment devices to complete the feed action, and image 3 Although the scheme shown solves the feeding problem of the antenna under test, it is limited by the limitations of the probe station structure when testing the pattern. It can only test the pattern of the upper half space, and the overall structure of the probe station It will have a certain impact on the electrical performance of the antenna and cause a certain test error, so the traditional connection method can no longer meet the test requirements of the on-chip antenna

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