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Method and system for measuring multispectral bidirectional reflectance distribution function of sample of any shape

A technology of bidirectional reflection distribution and measurement system, applied in the field of optical measurement instruments, can solve the problem of no multispectral bidirectional reflection distribution function measurement instrument, etc.

Active Publication Date: 2015-09-09
BEIJING INSTITUTE OF TECHNOLOGYGY
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

There is no multispectral birefringence distribution function measuring instrument that can measure samples of arbitrary shape

Method used

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  • Method and system for measuring multispectral bidirectional reflectance distribution function of sample of any shape
  • Method and system for measuring multispectral bidirectional reflectance distribution function of sample of any shape
  • Method and system for measuring multispectral bidirectional reflectance distribution function of sample of any shape

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Embodiment Construction

[0074] In order to understand the above-mentioned purpose, features and advantages of the present invention more clearly, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be noted that, in the case of no conflict, the embodiments of the present application and the features in the embodiments can be combined with each other.

[0075] In the following description, many specific details are set forth in order to fully understand the present invention. However, the present invention can also be implemented in other ways different from those described here. Therefore, the protection scope of the present invention is not limited by the specific details disclosed below. EXAMPLE LIMITATIONS.

[0076] The invention provides a multi-spectral bidirectional reflectance distribution function measurement system, such as figure 1 shown, including:

[0077] Spherical bracket 4, used for fixing L...

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Abstract

The invention relates to a method and a system for measuring a multispectral bidirectional reflectance distribution function of a sample of any shape. The system comprises a spherical bracket, a sample bracket, a light source array unit, a projector array unit, an imaging spectrometer array unit and a central control server. The method comprises the following steps: projecting a Gray code image to a to-be-measured sample by virtue of the projector array unit; projecting collimated light beams in different directions to the to-be-measured sample by virtue of the light source array unit; acquiring a multispectral image of the to-be-measured sample by virtue of the imaging spectrometer array unit; processing the Gray code image on the surface of the to-be-measured sample by virtue of the central control server, thereby obtaining the three-dimensional coordinate and normal of each sampling point on the to-be-measured sample; and processing the multispectral image under the illumination condition in different directions, thereby obtaining the multispectral bidirectional reflectance distribution function of the to-be-measured sample. According to the method and the system disclosed by the invention, the multispectral bidirectional reflectance distribution function data of the to-be-measured sample of any shape can be measured.

Description

technical field [0001] The invention relates to an optical measuring instrument, in particular to a multi-spectrum bidirectional reflection distribution function measuring system and method. Background technique [0002] The Bidirectional Reflectance Distribution Function (BRDF for short) refers to the spectral radiance dL of the surface micro-facet along the exit of the object r (unit is W / (m 2 sr μm)) and the spectral irradiance dE incident on the surface to be measured along the incident direction i (unit is W / (m 2 Ratio of μm)), such as figure 1 As shown, its formula is expressed as follows: [0003] [0004] In the formula, θi and φi represent the zenith angle and azimuth angle of the incident direction, respectively, θr and φr represent the zenith angle and azimuth angle of the reflection direction, respectively, and the incident light wavelength is λ. The BRF is a function with five dimensions. [0005] An omnidirectional reflectometer is usually used to meas...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/55
Inventor 李红松丁刚毅廖宁放吴文敏马建东
Owner BEIJING INSTITUTE OF TECHNOLOGYGY
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