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Plate specimen space charge distribution pressure-wave-propagation-method measuring device

A space charge, flat sample technology, applied in measuring devices, measuring electrical variables, instruments, etc., can solve the problems of easy interference of space charge distribution signals, inaccurate measurement, etc., to prevent electromagnetic interference, ensure firm clamping, The effect of reducing the difficulty of processing

Active Publication Date: 2015-08-12
NANJING NARI GROUP CORP
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The space charge measurement of flat sample based on the pressure wave method, the space charge distribution signal is easily disturbed, and the measurement is inaccurate

Method used

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  • Plate specimen space charge distribution pressure-wave-propagation-method measuring device
  • Plate specimen space charge distribution pressure-wave-propagation-method measuring device

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Embodiment Construction

[0032] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0033] Such as figure 1 As shown, a flat sample space charge distribution pressure wave method measurement device, including high voltage DC power supply 1, high voltage lead wire 2, signal shielding box 6, current limiting resistor 7, DC blocking capacitor 8, coaxial cable 9, sample shielding Box 11 , electrode measurement unit 100 , amplifier 20 , digital oscilloscope 21 , metal support 22 , high temperature drying box 24 , and laser 25 .

[0034] The current limiting resistor 7 and the DC blocking capacitor 8 are arranged in the signal shielding box 6 .

[0035] The electrode measurement unit 100 is set in the sample shielding box 11 , the sample shielding box 11 and the metal support 22 are set in the high temperature drying oven 24 , and the sample shielding box 11 is set on the metal support 22 .

[0036] Both the sample shiel...

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PUM

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Abstract

The invention discloses a plate specimen space charge distribution pressure-wave-propagation-method measuring device. The device comprises a high-voltage direct-current power supply (1), a high-voltage lead wire (2), a signal shielding box (6), a current-limiting resistor (7), a blocking capacitor (8), a coaxial cable (9), a specimen shielding box (11), an electrode measuring unit (100), an amplifier (20), a digital oscilloscope (21), a metal supporting column (22), a high-temperature drying box (24) and a laser (25). The device is capable of accurately measuring the space charge distribution of an electric insulating material, external interference is effectively eliminated, space charge measurement under different temperatures is realized by a corresponding heating device, and the space charge distribution measurement of a plate specimen insulating material under a direct current and a high voltage is realized; in addition, an electrode system is placed in a specimen shielding box, and voltage increasing loops such as the high-voltage lead wire and measuring loops such as the blocking capacitor are arranged in the signal shielding box, so that electromagnetic interference of the external environment is prevented.

Description

technical field [0001] The invention relates to a pressure wave method measuring device for the space charge distribution of a flat sample, in particular to a space charge measurement system based on the pressure wave method. Background technique [0002] Electrically insulating materials result in the formation of internal defects due to defects in their molecular structure. Under the action of the electric field, the carriers move along the direction of the electric field. When these carriers encounter the formed defects, they will be trapped by them, forming corresponding space charges. The Coulomb field and the applied electric field formed by these space charges will change the distribution of the original electric field, resulting in serious distortion of the electric field in the material, which will cause the development of the electric tree and lead to the destruction of the insulation. Therefore, space charge seriously affects the performance of electrical insulat...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R29/00
Inventor 朱智恩杨黎明郭世忠李栋
Owner NANJING NARI GROUP CORP
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