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Aging testing device and aging testing method for chip of nitrogen and oxygen sensor

A chip aging test, nitrogen and oxygen sensor technology, applied in the direction of single semiconductor device testing, etc., can solve the problems of unrealized mass production of nitrogen and oxygen sensor chips, and the aging test of nitrogen and oxygen sensor chips is in a blank state, so as to avoid excessive aging voltage Large, damage-avoiding effect

Inactive Publication Date: 2015-07-29
湖北丹瑞新材料科技有限公司
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AI Technical Summary

Problems solved by technology

At present, the stable mass production of nitrogen and oxygen sensor chips has not been realized in China, and the aging test of nitrogen and oxygen sensor chips is also in a blank state

Method used

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  • Aging testing device and aging testing method for chip of nitrogen and oxygen sensor

Examples

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Embodiment 1

[0032] The device provided in Example 1 can simultaneously age 20 nitrogen and oxygen sensor chips to be tested; wherein R1 is the sampling resistor on the first heating loop, R2 is the sampling resistor on the second heating loop, and R20 is the sampling resistor on the second heating loop. Twenty sampling resistors on the heating circuit; specifically, the positive pole of the aging power supply is connected to the first elastic terminal A1 of the fixture through the sampling resistor R1, and A1 clamps the nitrogen and oxygen sensor chip to be tested to heat the positive pole; the negative pole of the aging power supply is connected to the second elastic terminal of the fixture. The elastic terminal A2 is connected, and A2 clamps the nitrogen and oxygen sensor chip to be tested to heat the negative electrode; thus, the aging power supply, the sampling resistor R1 and the heating electrode of the first chip to be tested form a first heating circuit;

[0033] Similarly, the pos...

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Abstract

The invention discloses an aging testing device and an aging testing method for a chip of a nitrogen and oxygen sensor. The aging testing device comprises a communication module, a control module, a signal analyzing module, an aging power supply, a sampling resistor and a chip fixture, wherein the chip fixture is provided with an elastic binding post; an aging voltage is loaded to a heating electrode of the chip of the nitrogen and oxygen sensor via the binding post; the heating electrode of the chip of the nitrogen and oxygen sensor is provided with a resistor; under the effect of the aging voltage, the heating electrode of the chip of the nitrogen and oxygen sensor is heated; the aging voltage outputted by the aging power supply is adjusted in real time through the control module, and the purpose of circularly loading the aging voltage on the heating electrode of the chip of the nitrogen and oxygen sensor is achieved; and the sampling resistor acquires a voltage so as to acquire heating current data on the electrode of the chip, whether the heating electrode of the chip of the nitrogen and oxygen sensor to be tested is burnt out or not can be determined, aging testing is implemented, and the purpose of eliminating defective products is achieved. The aging testing device has the advantages of easiness in operation and convenience in data acquisition, monitoring and tracing.

Description

technical field [0001] The invention belongs to the technical field of chip testing, and more particularly relates to an aging testing device and an aging testing method for a nitrogen-oxygen sensor chip. Background technique [0002] With the continuous acceleration of the world's industrialization process, the number of global automobiles continues to grow rapidly, and automobile exhaust emissions have become the main air pollutants. The resulting environmental problems have become increasingly prominent, posing a great threat to the environment and human health. At present, the nitrogen oxide sensor is usually used in the after-treatment system of the automobile engine to measure the concentration of nitrogen oxides in the exhaust gas. According to the concentration value, corresponding measures are taken to reduce the emission of nitrogen oxides to meet the national standard. [0003] In order to ensure the service life of the nitrogen and oxygen sensor chip, the pressur...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26
Inventor 谭浩修吉平张敏环熊建杰肖建中
Owner 湖北丹瑞新材料科技有限公司
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