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A method for measuring the phase transition of matter under static pressure

A high-voltage, material-based technology, applied in the field of short-wavelength X-ray diffraction, can solve the problems of expensive and limited synchrotron radiation light sources, and achieve the effect of improving test efficiency and accuracy

Inactive Publication Date: 2017-05-10
MATERIAL INST OF CHINA ACADEMY OF ENG PHYSICS
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Problems solved by technology

However, the synchrotron radiation source is expensive and the experimental machine time is limited, which cannot provide experimental means for high-voltage researchers to realize their ideas in time

Method used

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  • A method for measuring the phase transition of matter under static pressure
  • A method for measuring the phase transition of matter under static pressure

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specific example 1

[0036] The method of the invention is used to study the high-pressure phase transition of bismuth (Bi). Proceed as follows,

[0037] Step 1: According to the requirements of the high pressure experiment, seal and fill the block of metal bismuth, and apply pressure by screwing the screw of the pressing machine on the reset device. Preliminarily locate the center of the press according to the position indicated by the laser.

[0038] Step 2: Move the detector to the coordinate origin, start the high-voltage gun, use 30kev, 0.5mA voltage and current to excite the tungsten target, and find the sampling center of the X-axis through the axial movement of the X-axis. The concave point is the sample position (such as figure 1 ).

[0039] Step 3: Move the detector to the origin of the coordinates, fix the position of the X-axis to the value determined in Step 2, start the high-voltage gun, use 30kev, 0.5mA voltage and current to excite the tungsten target, and find the position of t...

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Abstract

The invention discloses a method for measuring the phase transition of a substance under high static pressure. A short-wavelength X-ray diffraction method is adopted to measure the structural phase transition of the substance of a diamond anvil cell under high pressure. According to the method, high energy and high penetrability of short-wavelength X rays are utilized to realize X-ray diffraction of the material in the diamond anvil cell. The method has the characteristics that the testing efficiency and the testing precision are improved, a good experimental technological method is provided for high pressure researchers, the method is particularly suitable for phase transition research of high atomic numbers under high pressure and can provide a new way for the X-ray diffraction experiment under high pressure in a common experiment room.

Description

technical field [0001] The invention relates to a short-wavelength X-ray diffraction method, which is suitable for a diamond anvil high-pressure scientific X-ray diffraction method, and is used for measuring the crystal structure of a substance under high pressure so as to determine its phase change. Background technique [0002] Under the action of pressure, the volume of matter is compressed, and the internal atomic distance is reduced, which brings a series of changes, such as the redistribution and arrangement of electron density, the change of crystal structure, the change of energy band, and the change of photoelectromagnetic properties of matter, etc. , these phenomena are collectively referred to as high-pressure phase transitions. Its change mechanism provides researchers with a wider space to test the theoretical laws of physics and chemistry. [0003] At present, the experimental technology that provides a high-pressure environment is mainly the diamond anvil tec...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/207
Inventor 马策张鹏程窦作勇王茂银崔啟良祝洪祥李云陈力董平李瑞文朱旭
Owner MATERIAL INST OF CHINA ACADEMY OF ENG PHYSICS
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