Serial-parallel circuit for testing ageing of multiple direct-current power supplies

Abstract

The invention discloses a serial-parallel circuit for testing ageing of multiple direct-current power supplies. The serial-parallel circuit comprises a plurality of parallel power supply rail branches and an inverter, wherein each power supply serial branch consists of a diode D for avoiding commutation between the power supply serial branches, a voltage regulator for regulating voltage of each serial branch and a plurality of serial direct-current power supplies U; series-connected positive electrodes of the direct-current power supplies U are connected with a positive electrode of a diode D; series-connected negative electrodes of the direct-current power supplies U are connected with an input end of the voltage regulator; a negative electrode of the diode D is connected with a positive electrode input end of the inverter; an output end of the voltage regulator is connected with a negative electrode input end of the inverter; an output end of the inverter is connected with a power grid. The serial-parallel circuit is simple in structure, reasonable in design, convenient in wiring, high in practicability, good in using effect and convenient to popularize and use, can realize that a plurality of small-power power supplies participate in ageing simultaneously, and realizes energy recycling during ageing test of a medium-small-power power supply.

Description

technical field [0001] The invention relates to the technical field of power supplies, in particular to a series-parallel circuit for aging testing of multiple DC power supplies. Background technique [0002] As a power supply device for electronic equipment, DC power supply has been widely used in computer, communication, railway, aerospace, household appliances and other fields. In order to improve the stability and reliability of power supply products, manufacturers at home and abroad generally adopt the resistance energy consumption method to carry out aging tests on small and medium power supplies. China is the world's largest manufacturer of small and medium power power supply products. Traditional aging test methods cause huge waste of energy and poor adaptability to products of various capacity levels. Therefore, research on more economical and adaptable energy-saving aging test systems is of great importance. Very important. [0003] However, there are still a lot...

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Problems solved by technology

China is the world's largest manufacturer of small and medium power power supply products. Traditional aging test methods cause huge waste of energy and poor adaptability to products of various capacity levels. Therefore, research on more economical and adaptable energy-saving aging test systems is of great importance. very important

[0003] However, there are still a lot of problems in the aging of small and medium power DC power supplies. Among them, the aging energy of small and medium power DC power supplies is scattered, and it is difficult to achieve cost-effective energy feedback. For voltage source parallel circuits, there may be uneven current distribution between branches or circulation phenomena, etc.

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