Method and system for monitoring process based on slow feature analysis
A process monitoring and feature analysis technology, applied in special data processing applications, instruments, electrical digital data processing, etc., can solve problems such as no essential changes in dynamic characteristics, failure of process monitoring modules, and increased burden on operators.
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[0091] The embodiments of the present invention are described in detail below. Examples of the embodiments are shown in the accompanying drawings, in which the same or similar reference numerals indicate the same or similar elements or elements with the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary, and are only used to explain the present invention, and cannot be construed as limiting the present invention.
[0092] Those skilled in the art can understand that, unless specifically stated otherwise, the singular forms "a", "an", "said" and "the" used herein may also include plural forms. It should be further understood that the term "comprising" used in the specification of the present invention refers to the presence of the described features, integers, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, Integers, steps, operations, eleme...
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