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Weak light signal spectrum fast test device and method

A weak light and spectrum technology, applied in spectrum investigation and other directions, can solve the problems of complex structure of interference spectrum measurement system, inability to meet real-time and rapid on-site measurement, increase measurement time, etc., achieve fast measurement speed, remove random errors, improve intensity effect

Active Publication Date: 2015-02-11
西安应用光学研究所
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Problems solved by technology

[0002] Spectral measurement systems can generally be divided into two types: interferometric spectral measurement systems and spectroscopic spectral measurement systems. Among them, the interferometric spectral measurement system obtains the spectral information of signal light through Fourier transform, which is especially suitable for the detection of weak optical signals, but in practical applications Among them, the interferometric spectral measurement system has a complex structure and high cost; while the spectroscopic spectral measurement system is based on the principle of prism or grating, which separates the light to be measured by wavelength, detects optical signals of different wavelengths, and obtains the spectral characteristics of the signal. Usually, linear array CCD is used for spectrum testing. At present, in field spectrum measurement, there are more and more fast measurement requirements for weak signal spectra. For weak optical signals, linear array CCD generally adopts the method of increasing the integration time for measurement, and Only one set of spectral information can be collected each time, which cannot meet the accuracy requirements of the measurement. To achieve high-precision measurement, the average value of multiple measurement results must be taken, which increases the measurement time and cannot meet the requirements of real-time and fast measurement on site. Therefore, for the spectroscopic spectrum measurement system, at present, there are no relevant reports on the rapid measurement method of the weak light signal spectrum.

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  • Weak light signal spectrum fast test device and method
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  • Weak light signal spectrum fast test device and method

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Embodiment Construction

[0021] The present invention will be further described in detail below in conjunction with preferred embodiments.

[0022] In order to realize the rapid measurement of the spectrum of the weak light signal, the general idea of ​​the present invention is to use the area array CCD to measure the spectrum of the weak light signal multiple times at the same time, improve the measurement speed, and then superimpose the multiple measurement results to increase the output signal The strength of the signal-to-noise ratio is improved, and finally the measurement results are normalized. In this way, the accurate measurement of the relative spectral power distribution of the weak optical signal is realized, which meets the requirement of rapid measurement of the spectrum of the weak optical signal.

[0023] The rapid test device for weak optical signal spectrum in this embodiment includes an optical platform, a standard lamp, a grating spectroscopic system, a spectral data acquisition sy...

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Abstract

The invention provides a weak light signal spectrum fast measuring device and method. On the basis of a light source spectrum power distribution test method of a light splitting type spectrum measurement system, a face array CCD (charge coupled device) is adopted for replacing an original line array CCD, tiny light signals can simultaneously complete multiple times of measurement, the intensity of output signals can be improved through the processing on measuring results, meanwhile, the random noise is eliminated, and the fast measurement of the tiny light signal spectrum power distribution is realized. The weak light signal spectrum fast measuring method has the advantages that the measurement speed is high, the precision is high, the operation is simple, the universality is high, and the technical support is provided for the spectrum test of other kinds of spectrum instruments.

Description

technical field [0001] The invention belongs to the field of optical measurement and testing, and mainly relates to a testing method for the spectral distribution of a light source, in particular to a rapid testing device and method for the relative spectral power distribution of weak light signals. Background technique [0002] Spectral measurement systems can generally be divided into two types: interferometric spectral measurement systems and spectroscopic spectral measurement systems. Among them, the interferometric spectral measurement system obtains the spectral information of signal light through Fourier transform, which is especially suitable for the detection of weak optical signals, but in practical applications Among them, the interferometric spectral measurement system has a complex structure and high cost; while the spectroscopic spectral measurement system is based on the principle of prism or grating, which separates the light to be measured by wavelength, dete...

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Application Information

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IPC IPC(8): G01J3/28
Inventor 李燕杨鸿儒卢飞占春连李正琪
Owner 西安应用光学研究所
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