Automatic testing equipment and method for l3-layer circuit board
A technology of automated test and circuit
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[0042] The present invention will be described in further detail below in conjunction with the accompanying drawings and embodiments.
[0043] see figure 1 As shown, the automated testing equipment for the L3 layer line disk in the embodiment of the present invention includes a test subrack, a network management platform (computer) and an integrated instrument for connecting with the optical port of the L3 layer line disk; the test subrack It includes several test boards. Each test board has a serial port, a network port and an L3 layer circuit board installation slot. All the test boards are connected to each other through their respective serial ports, and the network port of any test board is connected to the network management platform.
[0044] There are automated test units inside the test subrack, see figure 2 As shown, the automated test unit includes a power supply module, a clock module, an FPGA (Field-Programmable Gate Array, Field Programmable Gate Array) module,...
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