A Microwave Signal Measurement Method Based on Fast Laser Scanning

A technology of microwave signal measurement and laser scanning, which is applied in the field of microwave photonics, can solve the problems of limited frequency measurement accuracy and frequency sweep rate, and cannot fully meet the needs of electronic warfare, and achieve the effect of high measurement speed

Active Publication Date: 2016-11-30
TSINGHUA UNIV
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Problems solved by technology

However, the frequency measurement accuracy and frequency scanning rate of this type of scheme are relatively limited, and cannot fully meet the needs of electronic warfare.

Method used

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  • A Microwave Signal Measurement Method Based on Fast Laser Scanning
  • A Microwave Signal Measurement Method Based on Fast Laser Scanning
  • A Microwave Signal Measurement Method Based on Fast Laser Scanning

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Embodiment Construction

[0026] The present invention proposes a microwave signal measurement method based on fast laser scanning, which will be described below in conjunction with the accompanying drawings.

[0027] First build as figure 1 The system structure diagram of the microwave measurement scheme based on the laser scanning source is shown; this figure is a serial channelized receiving device for microwave signal measurement based on fast laser scanning; it can be divided into a frequency sweeping source branch and a modulation branch (Mach-Zehnder modulator branch); the laser source is divided into two paths by the beam splitter, one path is used as the pump light source of the frequency sweep source, and the other path uses a Mach-Zehnder modulator to modulate the microwave signal to be measured onto the light (such as figure 2 (b) shown); after the two branch signals are coupled, they enter a narrow-band low-speed balanced photodetector for balanced detection, and finally perform low-speed...

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Abstract

The invention belongs to the technical field of microwave photonics, and in particular relates to a microwave signal measurement method based on fast laser scanning. The measurement system uses light scanning as a local oscillator, constructs multiple receiving channels serially in the time domain, and balances the microwave signals to be measured. Detection and demodulation, capable of measuring and analyzing broadband microwave signals within microseconds. When performing serial channelized reception, the modulated signal to be tested and the sweeping frequency source are subjected to beat frequency processing on the photodetector. When the receiving bandwidth is equal to the sweeping frequency interval, the frequency difference between it and the sweeping frequency is less than δf The modulated microwave signal to be tested can be detected in the corresponding channel after beating with the frequency sweep source; the serial channelized receiving system adopted in the present invention has great advantages in structure, and only one low-rate detection device is needed The signal reception of each channel can be realized, and the serial channelized receiving system can reach a very high measurement speed.

Description

technical field [0001] The invention belongs to the technical field of microwave photonics, and in particular relates to a microwave signal measurement method based on fast laser scanning. Specifically, a laser scanning structure is used to construct multiple receiving channels in time-domain series, which is suitable for real-time measurement of broadband microwave signals. Background technique [0002] In modern electronic warfare and radar applications, it is one of the basic goals of microwave signal processing to quickly and effectively obtain the frequency information of short-term burst signals. At present, the measurement of microwave multi-frequency signals is mainly based on channelized reception, frequency scanning and other schemes. Among them, the former is usually based on the idea of ​​frequency band segmentation, and a filter bank with multiple narrow subbands is the basic device to realize its spectrum segmentation, such as using a diffraction grating, Fabry...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04B17/30
Inventor 陈宏伟李瑞月雷诚陈明华谢世钟
Owner TSINGHUA UNIV
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