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Real-time temperature rise measurement method of electromagnetic system of low-voltage apparatus based on finite element analysis

A technology for electromagnetic systems and low-voltage electrical appliances, applied in the field of measurement, can solve the problems such as the inability to measure the maximum temperature rise of the electromagnetic system of low-voltage electrical appliances, the long and inaccurate measurement time period, etc., to improve the test efficiency and shorten the test time.

Inactive Publication Date: 2014-08-06
TONGJI UNIV
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Problems solved by technology

[0016] For this reason, what the present invention is to solve is the technical problem that the resistance method cannot measure the highest temperature rise of the electromagnetic system of low-voltage electrical appliances, and the measurement time period is long and inaccurate. method

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  • Real-time temperature rise measurement method of electromagnetic system of low-voltage apparatus based on finite element analysis
  • Real-time temperature rise measurement method of electromagnetic system of low-voltage apparatus based on finite element analysis
  • Real-time temperature rise measurement method of electromagnetic system of low-voltage apparatus based on finite element analysis

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Embodiment 1

[0047] The method for measuring the real-time temperature rise of the electromagnetic system of low-voltage electrical appliances based on finite element analysis of the present invention includes the following contents:

[0048] (1) Use the finite element simulation analysis software ANSYS to establish a three-dimensional thermal field model of the electromagnetic system of low-voltage electrical appliances, and conduct steady-state thermodynamic simulation analysis, including selecting the unit type of the model and defining the material properties of the model; establishing the geometric model of the electromagnetic system; selecting the sub-network Accuracy, grid division; calculation of coil heat generation and eddy current loss of electromagnet, hysteresis loss heat generation, analysis of heat exchange conditions; setting boundary conditions, applying thermal loads; setting the type of solution and performing steady-state thermodynamic simulation analysis; Output the tem...

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Abstract

The invention relates to a real-time temperature rise measurement method of an electromagnetic system of a low-voltage apparatus based on finite element analysis. The real-time temperature rise measurement method comprises the following steps that a temperature field distribution diagram of the electromagnetic system is obtained through finite element simulated analysis software, and a steady-state average value of the highest temperature inside a coil and the temperature on the surface of the coil is obtained under the different control voltages by calculation; the steady-state average value is compared with a steady-state value, measured in the given control voltage test, of the temperature on the surface of the coil, and correctness of a model is verified; a mathematical model of the highest temperature inside the coil and the temperature on the surface of the coil of the electromagnetic system of the low-voltage apparatus under the different control voltages is built, and the corresponding relation is found; the control voltage of the electromagnetic system of one low-voltage apparatus is measured, the temperature on the surface of the coil of the electromagnetic system is measured, the corresponding relation between the highest temperature inside the coil and the temperature on the surface of the coil under the control voltage is taken out, and the highest temperature inside the coil is calculated out. The real-time temperature rise measurement method can obtain the highest temperature rise of the coil of the electromagnetic system, directly judge the running state of products and break through the limitation that an existing measurement method only can measure the surface temperature and the average temperature.

Description

technical field [0001] The invention relates to the field of measurement technology, in particular to a method for measuring the real-time temperature rise of a low-voltage electrical apparatus electromagnetic system based on finite element analysis. Background technique [0002] Temperature testing is the most widely used, most complex, and most prone to test errors in the safety testing of low-voltage electrical appliances. Many products will have various problems in the test involving temperature, and the measurement method and accuracy will affect the qualification of the product. Sexual evaluation has a decisive impact. The temperature rise measurement of the electromagnetic system of low-voltage electrical appliances is more complicated. When an electrical appliance is working, current flows through the coil and heat is generated in the coil. For AC appliances, due to the action of the alternating electromagnetic field, eddy current and hysteresis loss will be genera...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
Inventor 黄世泽郭其一李凡璋陈聪
Owner TONGJI UNIV
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