Program code segment testing method, device and system

Abstract

The invention discloses a method, a device and a system for testing a code segment of a program. The method for testing the code segment of the program comprises the steps of invoking a position of a tested code segment in a tested program during testing the tested program, and setting a breakpoint / skip processing unit; operating the tested program, interrupting an execution process of the tested code segment by the breakpoint / skip processing unit during executing the tested program to the position of the tested code segment, and skipping the execution of the tested program to a test process; and operating a test code segment in a process of executing test and obtaining a test result. According to the method, the device and the system, the process execution of the tested code segment is controlled by a test process, so that the process execution is interrupted and then joined into the test process to finish testing of the code segment; and a test module is not required to be embedded in the tested program, so that the interference on the original tested program also can be avoided.

Description

technical field [0001] The invention belongs to the field of computer programs, and in particular relates to a program code segment testing method, device and system. Background technique [0002] With the increasing complexity of the current software system, the importance of software testing has been further reflected. [0003] In the prior art, the method of testing the binary program image includes embedding a test module inside the program, that is, program testing is performed by running a specific code segment. [0004] The inventor has found through research that the above-mentioned program testing method in the prior art needs to add a new test module, which will further increase the complexity of the program logic, and then may introduce new defects; thus, when a defect occurs , it is difficult to locate whether the defect is the test object, that is, the problem of the tested code segment itself is caused by the addition of the test module, that is, the program t...

AI Technical Summary

Problems solved by technology

[0004] The inventor found through research that the program testing method in the above prior art needs to add a new test module, which will further increase the logic complexity of the program, and then may introduce new defects; thus, when a defect occurs , it is difficult to locate whether the defect is the test object, that is, the problem of the tested code segment itself is caused by the addition of the test module, that is, the program testing method in the prior art will increase the complexity of the program, because the test module itself It is possible to introduce additional defects that interfere with the original program

Images