Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Strip Width and Center Measurement System and Method Based on Parallel Laser Lines

A measurement method and measurement system technology, applied in the direction of measurement devices, optical devices, instruments, etc., can solve the problems of vibration interference, poor real-time performance, etc., and achieve the effect of strong anti-vibration interference, low cost, and good stability

Active Publication Date: 2016-04-06
SUZHOU YIKADI SPORTS EQUIP CO LTD
View PDF2 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in the high-speed production line, there are disadvantages of poor real-time performance and vibration interference, which have become bottlenecks restricting the development of strip production-related industries.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Strip Width and Center Measurement System and Method Based on Parallel Laser Lines
  • Strip Width and Center Measurement System and Method Based on Parallel Laser Lines
  • Strip Width and Center Measurement System and Method Based on Parallel Laser Lines

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0013] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0014] refer to figure 1 , the measuring system structure of the present invention is, comprises the parallel laser source 6 that is arranged on conveying line directly above and detection sensor, and detection sensor is connected with FPGA processor 3 in addition,

[0015] The parallel laser source 6 adopts a parallel laser with a wavelength of 635nm to 650nm, which can emit parallel laser lines to the strip on the conveying line, with high power, long service life, easy installation and use, and the parallel laser source 6 irradiates vertically downward The parallel laser line should be perpendicular to the plane of the strip, and the parallel laser line illuminated on the strip must be perpendicular to the forward direction of the strip;

[0016] The FPGA processor 3 has a high-speed digital signal processing function, and the FPGA proces...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a strip width and center measurement system based on parallel laser rays, and further discloses a strip width and center measurement method based on the parallel laser rays. According to the method, an area array CCD is fixed, a light source of the parallel laser rays is made to be perpendicular to a strip, the area array CCD obtains signals related to the edges of the strip by detecting the parallel laser rays, the signals pass through an external high-speed A / D converter, then digital signals are obtained and then pass through an FPGA processor to be processed, and the signals are transmitted to an upper computer through a USB2.0, and finally a result is displayed. The strip width and center measurement system and method based on the parallel laser rays have the advantages of being high in detection precision, good in stability and simple in structural design.

Description

technical field [0001] The invention belongs to the technical field of photoelectric measurement, and relates to a strip width and center measurement system based on parallel laser lines, and also relates to a strip width and center measurement method based on parallel laser lines. Background technique [0002] With the increasing development of modern industry, the measurement of strip width and central parameters on high-speed production lines is an important problem that needs to be solved in modern industrial production. The degree of automation in the strip production process continues to increase, and the following industrial needs appear: In order to improve The yield of the strip is stable and the product quality is stable. The width of the strip needs to be measured during production. At the same time, in order to overcome the phenomenon of deviation during the winding process of the strip, the position of the center of the strip must be accurately determined. These...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/00G01B11/04
Inventor 杨延西白鹏鹏
Owner SUZHOU YIKADI SPORTS EQUIP CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com