Supporting device for microscope, microscope and microscope carrier

Abstract

The invention discloses a supporting device for a microscope, which is used for supporting a loading device. The supporting device is characterized by comprising a substrate and a plurality of protruding structures arranged on the substrate, and the top ends, used for being contacted with the loading device, of the protruding structures are located on the same horizontal plane. According to the supporting device for the microscope provided by the embodiment of the invention, the loading device is erected above the protruding structures, so that the direct contact area of the loading device and a carrier is reduced as small as possible by the adoption of the protruding structures, and accordingly, the probability of accumulating dust on the top ends of the protruding structures is reduced, the levelness of the loading device is improved, the condition that the loading device has different focus lengths due to the fact that the levelness of the loading device is lowered caused by dust accumulation is reduced, the tedious operation of repeated focusing is greatly reduced, and the use convenience of the microscope is improved. The invention also provides a microscope carrier and the microscope.

Description

technical field [0001] The invention relates to the technical field of microscopes, in particular to a support device for a microscope, a microscope and a microscope stage. Background technique [0002] In the process of using the microscope, place the loading device such as the slide or counting plate directly on the stage of the microscope, and ensure the horizontal placement of the loading device by contacting the bottom surface of the loading device with the top surface of the loading table. for easy detection. [0003] In order to accurately focus the slide on the stage, the common method is to move the stage. Due to the relatively large area of ​​the microscope stage, it is very difficult to control the flatness error of the entire stage within the micron level. When the flatness of the stage is poor, it is very easy to cause the focus of the slide on the stage to be out of focus; in addition, due to the dust in the air, it is inevitable to accumulate dust on the sta...

AI Technical Summary

Problems solved by technology

When the flatness of the stage is poor, it is very easy to cause the focus of the slide on the stage to be out of focus; in addition, due to the dust in the air, it is inevitable to accumulate dust on the stage of the microscope. As a result, the slide (or counting plate) cannot be in good contact with the stage, and the dust particles will cause the level of the stage to decrease, resulting in some areas on the stage not within the focal length of the microscope, which needs to be repeated. Adjustment, cumbersome operation

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