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Very large scale integration (VLSI) standard unit overall arranging method based on L1 form model

A global layout, L1 norm technology, applied in electrical digital data processing, special data processing applications, instruments, etc., can solve problems such as inability to guarantee layout quality, non-smooth density constraint function, bus length error, etc.

Inactive Publication Date: 2014-02-26
FUZHOU UNIV
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Problems solved by technology

[0005] However, there are two following problems in the existing global layout methods based on analytical methods: (1) in the global layout process, some approximate model (such as quadratic model, LSE model, Bound2bound model, etc.), so there is a large error in the bus length calculated after the approximation and the bus length of the sum of the half-perimeter line length, which is not a good reflection of the actual line length of the layout, so the quality of the layout cannot be guaranteed; (2 ) The density constraint function is non-smooth, and the existing layout algorithms using density control technology will D b ( x , y ) for smoothing

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  • Very large scale integration (VLSI) standard unit overall arranging method based on L1 form model
  • Very large scale integration (VLSI) standard unit overall arranging method based on L1 form model

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Embodiment Construction

[0072] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0073] The present invention is based on the L1 norm model global layout method of VLSI standard cells. Firstly, the circuit is expressed as a hypergraph, and the global layout problem of VLSI standard cells that adopts half-perimeter line length calculation and density constraints is non-smooth is modeled as L1 norm minimization problem, then cells are clustered using a modified optimal choice clustering algorithm for L1-norm models in the clustering phase, followed by clustering in the disintegration phase using a non-linear programming global placement method.

[0074] figure 1 It is a flow chart of the VLSI standard cell global layout method based on the L1 norm model of the present invention. Such as figure 1 Shown, the present invention is based on the VLSI standard cell global layout method of L1 norm model, specifically co...

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Abstract

The invention relates to a very large scale integration (VLSI) standard unit overall arranging method based on an L1 form model and belongs to the technical field of VLSI physical design automation. The method includes indicating a circuit as a super graph, modeling a VLSI standard unit overall arranging problem which adopts semi-cycle long-line calculation with the density constrained to be non-smooth into an L1 form minimum problem, adopting an optimum selection clustering algorithm applicable to modification of an L1 form model in a clustering stage to conduct clustering on a unit and conducting declustering on clusters in a declustering stage by adopting a nonlinear planning overall arranging method. The VLSI standard unit overall arranging method is reasonable in arrangement, high in efficiency, practical and good in arranging effect.

Description

technical field [0001] The invention relates to a global layout method of VLSI standard cells based on an L1 norm model, and belongs to the technical field of VLSI physical design automation. Background technique [0002] In the current VLSI layout, the scale of integrated circuits continues to increase and the requirements for technology are getting higher and higher, which puts forward higher requirements for the optimization goals and optimization methods of VLSI layout. The quality of the layout results directly affects the quality of the entire chip. performance. With the rapid growth of the number of units on a chip, especially the widespread application of millions of gate chips, it poses a huge challenge to the automation of VLSI layout design. Therefore, it is of great significance to seek more efficient and practical integrated circuit layout algorithms. [0003] Algorithms used to solve VLSI placement problems can be divided into the following three categories: ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
Inventor 朱文兴范更华陈建利
Owner FUZHOU UNIV
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