Method and device for measuring jitter time of mechanical switch contacts

Abstract

The invention discloses a method and device for measuring mechanical switch contact chatter time. Firstly, chatter time test software is started from a microcomputer, and initialization of an FPGA system is carried out after user settings are completed; secondly, states of mechanical switch contacts are sampled constantly, and state values are stored in an annular register; thirdly, whether the mechanical switch contacts are in a mechanical chatter state or not is judged in a state machine method according to the state values of the mechanical switch contacts obtained through constant sampling; fourthly, if the mechanical switch contacts are still in the mechanical chatter state, mechanical chatter time is accumulated, and the states of the mechanical switch contacts are sampled continuously; fifthly, after all the mechanical switch contacts keep stable, measurement data are uploaded to a PC and analysis and processing on the measurement data are carried out, and processing results are displayed on a software interface. The method and device for measuring the mechanical switch contact chatter time have the advantages of being easy and convenient to operate, high in measurement automation degree and capable of simultaneously measuring more than 200 mechanical switch contacts, and chatter time measurement accuracy can reach 0.01mS.

Description

technical field [0001] The invention relates to the field of test instruments, in particular to a method and a device for measuring the shaking time of mechanical switch contacts. Background technique [0002] Low-voltage electrical appliances with mechanical switch contacts, including relays, push button switches, temperature switches, knife switches, etc., are widely used in the fields of industrial automatic control, household appliances, power systems, and automation devices. In order to ensure the normal operation of low-voltage electrical appliances, manufacturers must strictly test the performance of low-voltage electrical appliances, especially the performance of mechanical switch contacts of low-voltage electrical appliances. [0003] According to the standards stipulated by the state and enterprises, it is very cumbersome and difficult to test and inspect low-voltage electrical appliances. Traditional simulation test methods are often used in China to test their pe...

AI Technical Summary

Problems solved by technology

[0003] According to the standards stipulated by the state and enterprises, it is very cumbersome and difficult to test and inspect low-voltage electrical appliances. Traditional simulation test methods are often used in China to test their performance. This method is not only inefficient, labor-intensive, slow in measurement speed, and large in error. The measurement of some test items stipulated in the standard is inaccurate, and even some items cannot be detected at all. For example, it is difficult to accurately measure the jitter time of mechanical switch contacts

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