Novel double-reflection type flight time mass spectrum photoelectron velocity imager
A technology of time-of-flight mass spectrometry and velocity imaging, which is applied in the field of mass spectrometry and energy spectrum analysis, and can solve problems such as the inability to directly provide material structure information and spectral data
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[0020] Combine below figure 1 And embodiment the present invention is described further.
[0021] Such as figure 1 As shown, the present invention is a novel dual-reflection time-of-flight mass spectrometry photoelectron velocity imager, which mainly includes a laser sputtering ion source (1), a time-of-flight mass spectrometer (2) and an anion photoelectron velocity imaging system (3). The laser sputtering ion source (1) generates cluster ions and enters the time-of-flight mass spectrometer (2) for detection to obtain the intensity distribution of the cluster ions; for specific cluster negative ions, the voltage of the reflector (13) of the time-of-flight mass spectrometer can be turned off, It is extracted from the time-of-flight mass spectrometer (2), and through the interaction with the desorption laser, neutral molecules and photoelectrons are generated. Finally, an anion photoelectron velocity imaging system (3) is used to detect outgoing photoelectrons, and a photoele...
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