Device and method used for measuring impulse response of photoelectric detector

Abstract

The invention relates to a device used for measuring impulse response of a photoelectric detector. The device comprises a multi-channel femtosecond pulse laser generator, a coplanar waveguide, an electric displacement platform, a waveguide probe, a coaxial-to-coplanar converter and a lock-in amplifier, wherein the multi-channel femtosecond pulse laser generator provides light sources for the electric displacement platform and the ultrafast photoelectric detector, the ultrafast electric pulse detector generates ultrafast electric pulses, the coaxial-to-coplanar converter transmits the received ultrafast electric pulses to the coplanar waveguide, and an ultrafast pulse electric field is generated on the coplanar waveguide; the waveguide probe is stimulated by laser of the electric displacement platform to generate a photosensitive current in the ultrafast pulse electric field, and the photosensitive current is sampled through the lock-in amplifier. The device has the advantages that on the basis of the time domain waveform of the ultrafast electric pulses in the photoelectric technology, the equivalent bandwidth of sampling of the waveguide can reach 300GHz, the impulse response of the photoelectric detector can be measured more accurately, and level of measurement on the impulse response of the photoelectric detector is improved.

Description

technical field [0001] The invention relates to a device for measuring the impulse response, in particular to a device and method for measuring the impulse response of a photoelectric detector. Background technique [0002] The traditional measurement device for measuring the impulse response of ultrafast photodetectors is to use a femtosecond laser generator to excite ultrafast photodetectors to generate ultrafast electrical pulses and measure the impulse responses of ultrafast photodetectors with a high-speed digital oscilloscope. The bottleneck of this measurement device lies in the high-speed digital oscilloscope. The bandwidth of the fastest commercial high-speed digital oscilloscope available in China is 100 GHz, and the rise time is about 4 ps, which cannot meet the measurement requirements of the ultra-fast photodetector impulse response. In addition, the impulse response measurement of a high-speed digital oscilloscope with a bandwidth exceeding 70 GHz has always be...

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Problems solved by technology

[0003] The technical problem to be solved by the present invention is to provide a device and method for photodetector impulse response measurement, which is used to solve the problem of ultrafast photodetector impulse response due to the limitation of oscilloscope bandwidth and its own impulse response in traditional devices. The measurement result of the response is the convolution of the impulse response of the ultra-fast photodetector and the impulse response of the oscilloscope itself, so that the real waveform of the impulse response of the ultra-fast photodetector cannot be measured, and many high-frequency components are lost. The measurement level of the impulse response of ultrafast photodetector

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